公开(公告)号：US20240248595A1

公开(公告)日：2024-07-25

申请号：US18562651

申请日：2022-05-12

申请人： SHIMADZU CORPORATION

发明人： Ryuji SAWADA ,  Takeshi ONO ,  Shuhei YAMAMOTO ,  Hiroaki TSUSHIMA

IPC分类号： G06F3/04847 ,  G06F3/0481 ,  G06V10/94

CPC分类号： G06F3/04847 ,  G06F3/0481 ,  G06V10/945

摘要： A data analysis apparatus (100) according to this invention includes a controller (10) configured to accept an operation of selection of an analysis data item(s) (500, 510, 520, 530), to accept an operation of selection of a script(s) to be used to analyze data based on the analysis data item(s) (500, 510, 520, 530), to accept an operation of adjustment of a parameter(s) to be used to execute the script(s), and to analyze the data by executing the script(s) based on the adjusted parameter(s).

公开(公告)号：US20240044810A1

公开(公告)日：2024-02-08

申请号：US18364603

申请日：2023-08-03

申请人： Shimadzu Corporation

发明人： Ryuji SAWADA ,  Hitomi YOSHIYAMA ,  Hiroaki TSUSHIMA

IPC分类号： G01N23/04 ,  G01N23/083 ,  G06T7/73

CPC分类号： G01N23/043 ,  G01N23/083 ,  G06T7/74 ,  G06T2207/20081 ,  G06T2207/10116

摘要： In an X-ray imaging, first and second images of X-ray images corresponding to different emission angles are generated. In the X-ray imaging system, based on positions of a target part included in an inspection target in the first and second images, and an angle difference between the emission angles of X-rays that are emitted to generate the first and second images, a three-dimensional position of the target part is calculated by using triangulation.

公开(公告)号：US20240265686A1

公开(公告)日：2024-08-08

申请号：US18565884

申请日：2022-09-08

申请人： SHIMADZU CORPORATION

发明人： Hiroaki TSUSHIMA ,  Shuhei YAMAMOTO ,  Takeshi ONO ,  Ryuji SAWADA

IPC分类号： G06V10/776 ,  G06V10/94 ,  G06V20/69

CPC分类号： G06V10/776 ,  G06V10/945 ,  G06V20/69

摘要： A memory capacity determination system (200) in learning of cell images (80) includes a learning processor (10) including a first processor (10a) configured to execute processes of training a learning model (21), and a memory (10b); a selector (45) configured to select between a training mode of training the learning model, and a validation mode of validating whether a capacity of the memory becomes insufficient; and a determiner (12d) configured to determine whether the capacity of the memory becomes insufficient in the verification mode; and a display (121) configured to give a notice based on a first determination result (32).

公开(公告)号：US20230409980A1

公开(公告)日：2023-12-21

申请号：US18331248

申请日：2023-06-08

申请人： SHIMADZU CORPORATION

发明人： Ryuji SAWADA ,  Hiroaki TSUSHIMA

IPC分类号： G06N20/00

CPC分类号： G06N20/00

摘要： A data analysis method includes a storage step of storing a plurality of learning algorithm groups each including a type of measurement data, a type of analysis of the measurement data, and a learning algorithm associated with each other, a learning algorithm selection step of selecting the learning algorithm based on input information, and a trained model generation step of generating a trained model based on training data and the learning algorithm.

公开(公告)号：US20230111880A1

公开(公告)日：2023-04-13

申请号：US17959800

申请日：2022-10-04

申请人： SHIMADZU CORPORATION

发明人： Hiroaki TSUSHIMA ,  Ryuji SAWADA ,  Takeshi ONO ,  Shuhei YAMAMOTO

IPC分类号： G06V10/72 ,  G06T7/00

摘要： A migration system of a learning model for cell image analysis is a system that migrates a learning model from a first learning device to a second learning device, in which the second learning device includes an algorithm consistency determination unit that determines, based on second algorithm specification information and first algorithm specification information, whether or not consistency is established between a first algorithm and a second algorithm, and a learning model parameter setting unit that sets a first parameter to be used together with the second algorithm.

公开(公告)号：US20210356400A1

公开(公告)日：2021-11-18

申请号：US17317646

申请日：2021-05-11

申请人： Shimadzu Corporation

发明人： Yusuke YOKOI ,  Momoyo YAMAKAWA ,  Naoya FUJIWARA ,  Hiroaki TSUSHIMA ,  Kenta ADACHI

IPC分类号： G01N21/70 ,  G01N3/32 ,  G01L1/24

摘要： A stress luminescence measurement device according to a first aspect is provided with a load application mechanism configured to deform a sample by applying a load to the sample, a light source configured to emit excitation light to a stress luminescent material 2 arranged on a surface of the sample, a camera configured to image luminescence of the stress luminescent material, and a controller configured to control the load application mechanism, the light source, and the camera. The controller acquires a deformation state of the sample at the imaging timing by the camera and stores the acquired deformation state of the sample in association with the image captured by the camera in a memory.

公开(公告)号：US20230143489A1

公开(公告)日：2023-05-11

申请号：US17972848

申请日：2022-10-25

申请人： SHIMADZU CORPORATION

发明人： Ryuji SAWADA ,  Takeshi ONO ,  Shuhei YAMAMOTO ,  Hiroaki TSUSHIMA

IPC分类号： G06F8/41 ,  G06N20/00

CPC分类号： G06F8/45 ,  G06N20/00

摘要： A data analysis apparatus includes a control unit that performs control of receiving an operation to select analysis data, control of receiving an operation to select a plurality of scripts that execute analysis on the selected analysis data, and control of executing analysis on the selected analysis data by the plurality of selected scripts in parallel. The data analysis apparatus also includes a display unit configured to display analysis results of the analysis data by the control unit on the same screen.

公开(公告)号：US20240068962A1

公开(公告)日：2024-02-29

申请号：US18363144

申请日：2023-08-01

申请人： Shimadzu Corporation

发明人： Hiroaki TSUSHIMA ,  Ryuji SAWADA

IPC分类号： G01N23/04 ,  G06T7/00

CPC分类号： G01N23/043 ,  G06T7/001 ,  G01N2223/401 ,  G01N2223/6462 ,  G06T2207/10121 ,  G06T2207/20081

摘要： An X-ray imaging system is configured to acquire first and second images from a teacher X-ray image including an inspection target. Discrimination information to discriminate at least one of an area of the inspection target in the first and second images, and an area of a defect part is acquired. Machine learning for producing a learned model is performed by using input teacher data sets based on the first and second images, and output teacher data sets based on the discrimination information.

公开(公告)号：US20210372868A1

公开(公告)日：2021-12-02

申请号：US17322088

申请日：2021-05-17

申请人： SHIMADZU CORPORATION

发明人： Yusuke YOKOI ,  Momoyo YAMAKAWA ,  Naoya FUJIWARA ,  Kenta ADACHI ,  Hiroaki TSUSHIMA ,  Tomoki SASAYAMA

IPC分类号： G01L1/24 ,  G06T7/00 ,  H04N5/272 ,  G06T3/40 ,  G06T11/00

摘要： Provided is a stress measurement device capable of easily grasping the behavior of a stress generation site in a sample. The stress measurement device is provided with a camera for imaging light emitted by a stress luminescent material, a controller for processing an image captured by the camera, and a display for displaying the image processed by the controller. The controller detects the stress generation site according to a luminescence distribution of the stress luminescent material for each of the plurality of time-series images captured by the camera and controls the display such that each stress generation site detected for each of the plurality of images is displayed on one image in a superimposed manner in mutually different display modes.