公开(公告)号：US20220099636A1

公开(公告)日：2022-03-31

申请号：US17479410

申请日：2021-09-20

Applicant: SHIMADZU CORPORATION ,  Osaka University

Inventor： Kei SHINADA ,  Satoshi MATSUOKA ,  Katsuhisa KITANO

IPC: G01N30/64 ,  G01N27/70

Abstract: A light source emits excitation light to discharge gas that flows through a dielectric tube. A ground electrode unit includes a first ground electrode and a second ground electrode arranged at a distance from each other in an axial direction of the dielectric tube. A high-voltage electrode is provided between the first ground electrode and the second ground electrode. A first distance between the first ground electrode and the high-voltage electrode is shorter than a second distance between the second ground electrode and the high-voltage electrode. A cover is provided on an outer wall of the dielectric tube at a position between the first ground electrode and the high-voltage electrode. The light source is arranged to emit excitation light such that an optical axis thereof is directed toward a position where the cover is not provided on the outer wall of the dielectric tube.

公开(公告)号：US20230417662A1

公开(公告)日：2023-12-28

申请号：US18276082

申请日：2021-12-08

Applicant: SHIMADZU CORPORATION

Inventor： Takashi ONO ,  Masahiro IHARA ,  Hiromasa MARUNO ,  Satoshi MATSUOKA ,  Eri MATSUTANI ,  Yusuke KOGA

IPC: G01N21/3563

CPC classification number: G01N21/3563 ,  G01N2021/3595

Abstract: One mode of an optical inspection apparatus according to the present invention is an optical inspection apparatus for optically inspecting an object, the optical inspection apparatus including: a biasing section (20) configured to apply, to a group of objects (23A) on a stage, a force for moving the group of objects away with respect to the stage (22); a catching section (24) including an adhesion portion (241) to which an object in the group of objects moved from the stage adheres; and an analysis section (3) configured to optically analyze the object caught by the catching section. This makes it possible to efficiently and satisfactorily perform optical analysis of individual microplastics by eliminating manual work of picking up the microplastics one by one.

公开(公告)号：US20130333444A1

公开(公告)日：2013-12-19

申请号：US13896138

申请日：2013-05-16

Applicant: SHIMADZU CORPORATION

Inventor： Masaki KANAI ,  Takahiro NISHIMOTO ,  Masanori NISHINO ,  Satoshi MATSUOKA

IPC: G01N30/90

CPC classification number: G01N30/90 ,  G01N30/30 ,  G01N30/54 ,  G01N30/6004 ,  G01N2030/3007

Abstract: Provided is a plate-type column which allows the temperature of its inner passage to be rapidly increased or decreased while ensuring the correctness of an analysis or other operations. A plate-type column 10 includes: a plate-shaped main body 11; projecting portions 12 and 13 protruding from a circumferential edge of the main body 11; and a fluid-flow passage 14 extending in the main body 11 and the projecting portions 12 and 13. An intermediate portion of the passage 14 is provided in the main body 11, while each of the end portions of the passage 14 extends from the main body 11 through the projecting portion 12 or 13, with each of the end portions being open to the outside at the tip of the projecting portion 12 or 13.

Abstract translation: 提供一种板型柱，其允许其内通道的温度快速增加或减少，同时确保分析或其他操作的正确性。 板状柱10包括：板状主体11; 从主体11的周缘突出的突出部12,13; 以及在主体11和突出部分12和13中延伸的流体流动通道14.通道14的中间部分设置在主体11中，而通道14的每个端部从主体 主体11穿过突出部分12或13，其中每个端部在突出部分12或13的尖端处向外开口。