MASS SPECTROMETER AND PROGRAM FOR MASS SPECTROMETER

    公开(公告)号:US20220238318A1

    公开(公告)日:2022-07-28

    申请号:US17609672

    申请日:2019-08-07

    Abstract: A mass spectrometer according to one aspect of the present invention includes an ion source (31), a mass separator (32), and a detector (33), the mass spectrometer further including: a parameter optimization unit (531, 532, 533) configured to optimize a parameter value using a Bayesian optimization method based on a result obtained by making measurements while changing values of device parameters including a plurality of parameters that affects ionization efficiency in the ion source (31), a display processor (536) configured to display a sensitivity model which is a posterior distribution indicating a relationship between a plurality of parameters in all or some of the device parameters and signal strength estimated during the optimization of the device parameters, expressing as a graph like a heat map or an array of a plurality of the graphs on a display unit (7), and to sequentially update the sensitivity model, and a file creation unit (535) configured to a user to designate a position on the displayed graph, and to create a method file containing a measurement condition used for sample measurement, based on a combination of values of parameters corresponding to the designated position.

    MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

    公开(公告)号:US20220216042A1

    公开(公告)日:2022-07-07

    申请号:US17605410

    申请日:2019-06-06

    Abstract: A mass spectrometer includes an ionization unit, a mass separation unit, a detection unit, a first measurement control unit configured to control the ionization unit to repeatedly execute a first measurement on a target sample while changing values of a plurality of parameters defined as device parameters, a second measurement control unit configured to control the ionization unit to set a value of each of the plurality of parameters to a predetermined reference value and execute a second measurement on the target sample at two or more time points before, after, or in a middle of repetition of the first measurement, a correction processing unit configured to correct results of the first measurements using results of the second measurements, and a device parameter-related information acquisition unit configured to determine the plurality of parameters using the corrected measurement results or acquire reference information for determining the plurality of parameters.

    WAVEFORM PROCESSING DEVICE FOR CHROMATOGRAM AND WAVEFORM PROCESSING METHOD FOR CHROMATOGRAM

    公开(公告)号:US20220107294A1

    公开(公告)日:2022-04-07

    申请号:US17494877

    申请日:2021-10-06

    Abstract: A sample chromatogram produced by measurement of a mobile phase into which a sample has been injected is acquired by a sample chromatogram acquirer. A background chromatogram produced by measurement of a mobile phase into which a sample is not injected or a mobile phase into which a control sample is injected is acquired by a background chromatogram acquirer. Alignment of a sample chromatogram and a background chromatogram is performed by an alignment processor by causing of baselines of the acquired sample chromatogram and the acquired background chromatogram to coincide with each other. Subtraction processing of subtracting a background chromatogram from a sample chromatogram after alignment is executed by a subtraction processor.

    PARAMETER-SEARCHING METHOD, PARAMETER-SEARCHING DEVICE, AND PROGRAM FOR PARAMETER SEARCH

    公开(公告)号:US20210089952A1

    公开(公告)日:2021-03-25

    申请号:US16959704

    申请日:2019-04-24

    Abstract: A model estimator (11) estimates a model function of an analyzing system (20) based on target observation data and reference observation data. For this estimation, the amount of variation between the model of the target system and that of a reference model is estimated from the target observation data and reference observation data. The model function of the target model is estimated after the observation data are corrected based on the estimated amount of variation. A parameter determiner (12) calculates an acquisition function based on the mean and covariance of the model function, and determines a parameter value for the next observation, using the acquisition function. A data acquirer (13) sets the parameter value in the analyzing system (20) and acquires a corresponding observed value. A loop process with the feedback of the observation data is repeated to determine an optimal parameter value. In the case of a parameter search using a multi-task Bayesian optimization method, the present technique improves the efficiency of the parameter search even if the correlation between the target observation data and reference observation data is low.

    WAVEFORM PROCESSING ASSISTANCE DEVICE AND WAVEFORM PROCESSING ASSISTANCE METHOD

    公开(公告)号:US20220146471A1

    公开(公告)日:2022-05-12

    申请号:US17518750

    申请日:2021-11-04

    Abstract: A waveform processing assistance device includes an acquirer that acquires a correspondence relationship between a plurality of values of a waveform processing parameter and a plurality of results of waveform processing as a plurality of peak separation information pieces in regard to a plurality of peaks that are separated from one or a plurality of waveform data pieces based on the plurality of values of the waveform processing parameter, a determiner that determines robustness of each value of the waveform processing parameter based on a plurality of peak separation information pieces acquired by the acquirer, and a display controller that causes the display to display a plurality of peak separation information pieces acquired by the acquirer and a robustness information piece representing robustness of each value of the waveform processing parameter that is calculated by the determiner.

    MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

    公开(公告)号:US20220199382A1

    公开(公告)日:2022-06-23

    申请号:US17601456

    申请日:2019-05-08

    Abstract: A mass spectrometer according to an aspect of the present invention includes, to optimize N (where N is an integer of 2 or more) parameters that affect ionization efficiency in an ion source (31), a measurement controller (41) that causes respective units to repeatedly execute measurement on a sample containing a target component while changing values of the N parameters or a value set of M (where M is an integer smaller than N) parameters, in a plurality of stages, and a parameter determiner (53) that sequentially finds an optimum value for each parameter based on a result of the measurement executed under control of the measurement controller (41). At least one parameter whose physical quantity is temperature is optimized prior to all of the parameters whose physical quantities are other than temperature.

    WAVEFORM PROCESSING ASSISTANCE DEVICE AND WAVEFORM PROCESSING ASSISTANCE METHOD

    公开(公告)号:US20220198177A1

    公开(公告)日:2022-06-23

    申请号:US17548547

    申请日:2021-12-12

    Abstract: A waveform processing assistance device includes an acquirer that acquires a plurality of waveform data obtained by an analysis of a sample, a selector that selects reference data among the waveform data, an extractor that extracts correct answer peaks and correct answer data from the reference data a determiner that determines each processing section including a correct answer peak and each parameter initial value, a waveform processor that performs waveform processing in each determined processing section based on each parameter initial value, an adjuster that generates a parameter adjustment value at which a waveform processing result obtained in each processing section matches or approximates corresponding correct answer data, and a program creator that creates a waveform processing execution program that includes an instruction to execute waveform processing using the parameter adjustment value in each processing section.

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