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公开(公告)号：US20210232090A1
公开(公告)日：2021-07-29
申请号：US17156591
申请日：2021-01-24
Applicant: Shimadzu Corporation
Inventor： Yusuke TAGAWA , Ryo TAKEDA
Abstract: The accuracy of estimation of a focal distance in digital holography is enhanced. In an image reproduction method, a two-dimensional power spectrum is generated from an interference fringe image generated from object light and reference light, the two-dimensional power spectrum having an intensity specified by a first frequency in a first direction and a second frequency in a second direction. A one-dimensional power spectrum is generated by, for each frequency component specified by the first frequency and the second frequency in the two-dimensional power spectrum, associating the frequency component with a feature quantity, the feature quantity being calculated by aggregating a plurality of intensities corresponding to the frequency component. A focal distance between an object and a detector is estimated using a trained distance estimation model, the trained distance estimation model receiving, as input, a plurality of feature quantities included in the one-dimensional power spectrum.
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公开(公告)号：US20210089952A1
公开(公告)日：2021-03-25
申请号：US16959704
申请日：2019-04-24
Applicant: SHIMADZU CORPORATION
Inventor： Yusuke TAGAWA , Yuki ISHIKAWA
IPC: G06N7/00 , G06F16/951 , G06F17/15
Abstract: A model estimator (11) estimates a model function of an analyzing system (20) based on target observation data and reference observation data. For this estimation, the amount of variation between the model of the target system and that of a reference model is estimated from the target observation data and reference observation data. The model function of the target model is estimated after the observation data are corrected based on the estimated amount of variation. A parameter determiner (12) calculates an acquisition function based on the mean and covariance of the model function, and determines a parameter value for the next observation, using the acquisition function. A data acquirer (13) sets the parameter value in the analyzing system (20) and acquires a corresponding observed value. A loop process with the feedback of the observation data is repeated to determine an optimal parameter value. In the case of a parameter search using a multi-task Bayesian optimization method, the present technique improves the efficiency of the parameter search even if the correlation between the target observation data and reference observation data is low.
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公开(公告)号：US20250005786A1
公开(公告)日：2025-01-02
申请号：US18691356
申请日：2022-07-08
Applicant: SHIMADZU CORPORATION
Inventor： Tomotaka NAGASHIMA , Yusuke TAGAWA , Kazuma TAKAHARA , Shinji IMAI , Seiya KURATA
Abstract: A camera that picks up an image of an object arranged in a real space and a controller are provided. The controller includes a setting unit that sets a target range in the real space, an obtaining unit that obtains a position and a posture of the camera, a determination unit that determines whether or not an object included in an image picked up by the camera is included in the target range based on the position and the posture of the camera, and an image processor that performs image processing on the image picked up by the camera, the image processing selected depending upon a result of determination by the determination unit.
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公开(公告)号：US20220253508A1
公开(公告)日：2022-08-11
申请号：US17294181
申请日：2019-11-14
Applicant: SHIMADZU CORPORATION
Inventor： Yusuke TAGAWA , Akira NODA , Wataru TAKAHASHI , Tetsuya KOBAYASHI
Abstract: A computer calculates interference fringe phase estimated value data (30) of a phase-restored object image by performing iterative approximation calculation using interference fringe intensity data (10) measured by a digital holography apparatus and interference fringe phase initial value data (20), which is an estimated initial phase value of the image of the object. The interference fringe phase initial value data (20) is calculated by an initial phase estimator (300). The initial phase estimator (300) is constructed by implementing machine learning using interference fringe intensity data and the like for learning. The computer acquires reconfigured intensity data (40) and reconfigured phase data (50) by performing optical wave propagation calculation using the interference fringe phase estimation value data (30) of the image of the object acquired through phase restoration, and the interference fringe intensity data (10) used as input data for the initial phase estimator (300). This provides an iterative approximation calculation method and the like capable of making an initial value of a solution used in the iterative approximation calculation method a value close to the true value.
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公开(公告)号：US20170343823A1
公开(公告)日：2017-11-30
申请号：US15534560
申请日：2015-12-02
Applicant: SHIMADZU CORPORATION
Inventor： Yusuke TAGAWA , Kaname HASEBE , Kazuho TAWADA
CPC classification number: G02B27/0179 , G02B27/0172 , G02B2027/0181 , G02B2027/0187 , G02B2027/0198 , G06T5/006 , G06T7/248 , G09G3/001 , G09G5/00 , G09G5/377
Abstract: This dynamic image processing device (20) for a head mounted display includes an attitude detection means (30) capable of detecting the attitude of an imaging device affixed to the head of a user, a first image deviation amount calculation means (41) that calculates a first image deviation amount (G1) in the yawing and pitching directions of the imaging device based on the detection result of the attitude detection means, a second image deviation amount calculation means (42) that calculates a second image deviation amount (G2) between a past image (52) and a current frame image (51) based on the first image deviation amount, the current frame image captured by the imaging device, and the past image, and an image synthesis means (43) that corrects the past image based on the second image deviation amount and synthesizes the past image and the current frame image.
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Patent Agency Ranking
公开(公告)号：US20220238318A1
公开(公告)日：2022-07-28
申请号：US17609672
申请日：2019-08-07
Applicant: SHIMADZU CORPORATION
Inventor： Yuki ISHIKAWA , Yusuke TAGAWA
Abstract: A mass spectrometer according to one aspect of the present invention includes an ion source (31), a mass separator (32), and a detector (33), the mass spectrometer further including: a parameter optimization unit (531, 532, 533) configured to optimize a parameter value using a Bayesian optimization method based on a result obtained by making measurements while changing values of device parameters including a plurality of parameters that affects ionization efficiency in the ion source (31), a display processor (536) configured to display a sensitivity model which is a posterior distribution indicating a relationship between a plurality of parameters in all or some of the device parameters and signal strength estimated during the optimization of the device parameters, expressing as a graph like a heat map or an array of a plurality of the graphs on a display unit (7), and to sequentially update the sensitivity model, and a file creation unit (535) configured to a user to designate a position on the displayed graph, and to create a method file containing a measurement condition used for sample measurement, based on a combination of values of parameters corresponding to the designated position.
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公开(公告)号：US20220216042A1
公开(公告)日：2022-07-07
申请号：US17605410
申请日：2019-06-06
Applicant: SHIMADZU CORPORATION
Inventor： Yusuke TAGAWA , Yuki ISHIKAWA
Abstract: A mass spectrometer includes an ionization unit, a mass separation unit, a detection unit, a first measurement control unit configured to control the ionization unit to repeatedly execute a first measurement on a target sample while changing values of a plurality of parameters defined as device parameters, a second measurement control unit configured to control the ionization unit to set a value of each of the plurality of parameters to a predetermined reference value and execute a second measurement on the target sample at two or more time points before, after, or in a middle of repetition of the first measurement, a correction processing unit configured to correct results of the first measurements using results of the second measurements, and a device parameter-related information acquisition unit configured to determine the plurality of parameters using the corrected measurement results or acquire reference information for determining the plurality of parameters.
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公开(公告)号：US20160363544A1
公开(公告)日：2016-12-15
申请号：US14735112
申请日：2015-06-09
Applicant: SHIMADZU CORPORATION
Inventor： Yusuke TAGAWA , Hiroshi OOHARA , Yoshihiro UENO
CPC classification number: G01N23/046 , G01T7/08
Abstract: In an X-ray inspecting apparatus, a rotational fluctuation amount of a stage is calculated around a power transmission part of the stage and a stage drive unit as a base point, i.e., the X-axis and Y-axis sliding parts, in accordance with detected positional information from a position detecting sensor. Then, a stage shift amount is calculated in accordance with the rotational fluctuation amount and a distance between the base point and an imaging position on the stage. Here, the stage shift amount corresponds to a positional deviation of the stage at the imaging position caused by an attitude variation of the stage in a yawing direction, and thus is an error in repeated positioning. Accordingly, a tomographic image with high resolution can be generated in consideration of the error in repeated positioning.
Abstract translation: 在X射线检查装置中，在台架的动力传递部分和作为基点的台架驱动单元（即，X轴和Y轴滑动部件）周围计算阶段的旋转变动量 检测来自位置检测传感器的位置信息。 然后，根据旋转变动量和基点与台面上的摄像位置之间的距离来计算舞台偏移量。 这里，舞台偏移量对应于由舞台在偏航方向上的姿态变化引起的成像位置处的舞台的位置偏差，因此是重复定位中的错误。 因此，考虑到重复定位中的误差，可以产生具有高分辨率的断层图像。
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公开(公告)号：US20220199382A1
公开(公告)日：2022-06-23
申请号：US17601456
申请日：2019-05-08
Applicant: SHIMADZU CORPORATION
Inventor： Yusuke TAGAWA , Yuki ISHIKAWA
Abstract: A mass spectrometer according to an aspect of the present invention includes, to optimize N (where N is an integer of 2 or more) parameters that affect ionization efficiency in an ion source (31), a measurement controller (41) that causes respective units to repeatedly execute measurement on a sample containing a target component while changing values of the N parameters or a value set of M (where M is an integer smaller than N) parameters, in a plurality of stages, and a parameter determiner (53) that sequentially finds an optimum value for each parameter based on a result of the measurement executed under control of the measurement controller (41). At least one parameter whose physical quantity is temperature is optimized prior to all of the parameters whose physical quantities are other than temperature.
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10.发明申请公开(公告)号：US20210350513A1
公开(公告)日：2021-11-11
申请号：US17282229
申请日：2018-10-03
Applicant: Shimadzu Corporation
Inventor： Wataru TAKAHASHI , Yusuke TAGAWA
Abstract: This production method of a trained model (10) includes a step of optimizing a training model (11) so that a value of a loss function (A) becomes small. The loss function (A) is configured to output a relatively large value in a case where the contrast of the predetermined area (PA) in a brightness-adjusted image adjusted in brightness becomes high with respect to training data (20) than in a case where the contrast of the predetermined area in the brightness-adjusted image (3) becomes low with respect to the training data.
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