公开(公告)号：US12007340B2

公开(公告)日：2024-06-11

申请号：US17624554

申请日：2020-04-08

申请人： SHIMADZU Techno-Research, Inc.

发明人： Takashi Nakayama ,  Atsuhiro Hayashi

IPC分类号： G01N23/046 ,  A61B6/00 ,  G01N3/20

CPC分类号： G01N23/046 ,  A61B6/54 ,  G01N3/20

摘要： The present invention provides an X-ray CT apparatus capable of obtaining a high-quality X-ray CT image by suppressing occurrence of an artifact. The X-ray CT apparatus including an X-ray imaging system including an X-ray irradiation unit and an X-ray detector, a rotating stage disposed between the X-ray irradiation unit and the X-ray detector, a rotation mechanism configured to relatively rotate the X-ray imaging system and the rotating stage about a rotation axis orthogonal to an optical axis of an X-ray that runs from the X-ray irradiation unit to the X-ray detector, and a load mechanism which is set on the stage and applies test force to a test piece includes an angle changing mechanism that tilts a bending tester to change the direction of the test force applied to the test piece by the bending tester from a direction orthogonal to the optical axis of the X-ray.

公开(公告)号：US11353410B2

公开(公告)日：2022-06-07

申请号：US16568881

申请日：2019-09-12

申请人： SHIMADZU TECHNO-RESEARCH, INC.

发明人： Takashi Nakayama ,  Tomohide Daigen ,  Nobuyoshi Tsumaki

IPC分类号： G01N23/04 ,  G01N23/046 ,  G01N23/06 ,  G01N23/083 ,  G01N23/087 ,  G01N23/18

摘要： A grip portion configured to support a test piece is disposed at a central part of a base, and a plurality of pillars are erected on the base. A disposition and number of the plurality of pillars are adjusted so that an X-ray emitted from an X-ray source and transmitting through the test piece transmits through zero or one pillar in an optional image capturing direction. It is possible to avoid a situation in which an attenuation rate of the X-ray largely differs due to a difference in an image capturing direction to the test piece. Thus, it is possible to prevent a strong artifact from overlapping a CT image of the test piece in an X-ray CT image. Moreover, a material testing machine is supported by the plurality of pillars to have an accessible state around the test piece. This configuration facilitates handling of the material testing machine.