公开(公告)号：US11995816B2

公开(公告)日：2024-05-28

申请号：US17595608

申请日：2020-04-24

Applicant: SHOWA DENKO K.K.

Inventor： Yoshishige Okuno ,  Eriko Takeda ,  Junichi Shibuya ,  Yuki Nakao ,  Kenji Ogawa

IPC: G06T7/00 ,  G01N15/14 ,  G01N15/1434 ,  G06T7/60 ,  G06V10/74 ,  G06V10/75

CPC classification number: G06T7/001 ,  G01N15/1434 ,  G06T7/60 ,  G06V10/752 ,  G06V10/761 ,  G01N2015/1497 ,  G06T2207/10056 ,  G06T2207/20084 ,  G06T2207/30136

Abstract: To improve a determination accuracy when determining each particle contained in an image of an object. An image analysis apparatus according to an embodiment of the present invention includes: a shape determination unit configured to determine a shape of a particle included in a particle image that is extracted from an image of an object, so that an OK particle image which is a particle image of an OK particle that satisfies a predetermined standard for shape and a provisional NG particle image which is a particle image of a provisional NG particle that does not satisfy the predetermined standard, are obtained; a pseudo image generation unit configured to generate a pseudo image; and a similarity determination unit configured to determine whether the provisional NG image and the pseudo image are similar.