Semiconductor integrated circuit device

    公开(公告)号:US11908799B2

    公开(公告)日:2024-02-20

    申请号:US17322570

    申请日:2021-05-17

    Applicant: SOCIONEXT INC.

    CPC classification number: H01L23/5286 H01L23/535 H01L27/092

    Abstract: A layout structure of a capacitance cell using a complementary FET (CFET) is provided. A capacitance part includes a first three-dimensional transistor of a first conductivity type and a second three-dimensional transistor of a second conductivity type formed above the first transistor in the depth direction. The source and drain of the first transistor are both connected to VDD or VSS, and the source and drain of the second transistor are both connected to VDD or VSS. The gates of the first and second transistors are both connected to the gate of a transistor included in a fixed-value output part, and are supplied with VDD or VSS.

    Semiconductor device
    2.
    发明授权

    公开(公告)号:US12191345B2

    公开(公告)日:2025-01-07

    申请号:US18598870

    申请日:2024-03-07

    Applicant: Socionext Inc.

    Abstract: A semiconductor device includes a substrate; a first semiconductor region formed over the substrate; a second semiconductor region formed over the substrate, and electrically connected to the first semiconductor region; a third semiconductor region formed over the substrate, and positioned between the first semiconductor region and the second semiconductor region; a fourth semiconductor region formed over the first semiconductor region; a fifth semiconductor region formed over the second semiconductor region, and electrically connected to the fourth semiconductor region; a sixth semiconductor region formed over the third semiconductor region, and positioned between the fourth semiconductor region and the fifth semiconductor region; and wires formed between the first semiconductor region and the second semiconductor region, and between the fourth semiconductor region and the fifth semiconductor region, to cover the third semiconductor region and the sixth semiconductor region, the wires including conductors.

    Semiconductor integrated circuit device

    公开(公告)号:US12094882B2

    公开(公告)日:2024-09-17

    申请号:US17719052

    申请日:2022-04-12

    Applicant: Socionext Inc.

    CPC classification number: H01L27/11807 H01L2027/11881

    Abstract: In a power line structure for supplying power to standard cells, buried power lines extending in the X direction are placed at a given spacing in the Y direction. A local power line extending in the Y direction is connected with the buried power lines. Metal power lines extending in the X direction are formed in an upper-layer metal interconnect layer and connected with the local power line. The spacing of placement of the metal power lines in the Y direction is greater than the spacing of placement of the buried power lines.

    Semiconductor integrated circuit device

    公开(公告)号:US12255141B2

    公开(公告)日:2025-03-18

    申请号:US18410874

    申请日:2024-01-11

    Applicant: SOCIONEXT INC.

    Abstract: A layout structure of a capacitance cell using a complementary FET (CFET) is provided. A capacitance part includes a first three-dimensional transistor of a first conductivity type and a second three-dimensional transistor of a second conductivity type formed above the first transistor in the depth direction. The source and drain of the first transistor are both connected to VDD or VSS, and the source and drain of the second transistor are both connected to VDD or VSS. The gates of the first and second transistors are both connected to the gate of a transistor included in a fixed-value output part, and are supplied with VDD or VSS.

    Semiconductor device
    6.
    发明授权

    公开(公告)号:US11955508B2

    公开(公告)日:2024-04-09

    申请号:US17546463

    申请日:2021-12-09

    Applicant: Socionext Inc.

    Abstract: A semiconductor device includes a substrate; a first semiconductor region formed over the substrate; a second semiconductor region formed over the substrate, and electrically connected to the first semiconductor region; a third semiconductor region formed over the substrate, and positioned between the first semiconductor region and the second semiconductor region; a fourth semiconductor region formed over the first semiconductor region; a fifth semiconductor region formed over the second semiconductor region, and electrically connected to the fourth semiconductor region; a sixth semiconductor region formed over the third semiconductor region, and positioned between the fourth semiconductor region and the fifth semiconductor region; and wires formed between the first semiconductor region and the second semiconductor region, and between the fourth semiconductor region and the fifth semiconductor region, to cover the third semiconductor region and the sixth semiconductor region, the wires including conductors.

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