公开(公告)号：US11852676B2

公开(公告)日：2023-12-26

申请号：US17672588

申请日：2022-02-15

Applicant: STMICROELECTRONICS S.R.L.

Inventor： Carlo Caimi ,  Massimiliano Pesaturo ,  Stefano Antonio Mastrorosa ,  Alfredo Lorenzo Poli ,  Marco Della Seta

IPC: G01R31/28 ,  G01R31/00 ,  G01R31/317 ,  G01R31/3187 ,  G01R31/3185

CPC classification number: G01R31/2856 ,  G01R31/007 ,  G01R31/3187 ,  G01R31/31703 ,  G01R31/31724 ,  G01R31/318525

Abstract: An integrated circuit includes a sub-system and a reference sub-system. The reference sub-system is substantially identical to the sub-system but is non-operating by default. The integrated circuit includes a test circuit that obtains a parameter value of the sub-system and a reference parameter from the reference sub-system. The integrated circuit detects deterioration of the sub-system based on the parameter value and the reference parameter. The integrated circuit deactivates the sub-system and activates the reference sub-system responsive to detecting deterioration of the sub-system.