Abstract:
The sampling of a pixel signal by a sampling capacitor is effectuated by applying to the sampling capacitor a voltage equal to the corresponding pixel voltage minus the value of the gate-source voltage of a follower transistor biased with a predetermined constant bias current for a first predetermined duration so as to obtain for the sampling capacitor a final state of stable charge. The bias current is then interrupted. Lastly, the end of the sampling pulse occurs on completion of a second predetermined duration after the said interruption of the current.
Abstract:
A low-noise CMOS active pixel for image sensors comprises a photosensitive element (PD), a feedback capacitive element (CF) with a capacitance CF, and four transistors, namely a first transistor (M1), two reset transistors (M3, M4) and one pixel selection transistor (M2). These components are laid out and controlled in such a way that the first transistor (M1) is mounted as an amplifier during the pixel reset phase and as a follower during the read phase. The reset transistors (M3, M4) are parallel-connected so that one of them (M4) compensates for the negative effects of the other transistor (M3) on the node common to the two transistors.
Abstract:
A CMOS active pixel for image sensors has a photosensitive element, a capacitive feedback element with a capacitance CF, and four transistors, namely a first transistor, two reset transistors and a transistor for the selection of the pixel. These transistors are laid out and controlled in such a way that the first transistor is mounted as an amplifier during the pixel reset phase and as a follower during the read phase.