INTEGRATED DEVICE WITH DEEP PLUG UNDER SHALLOW TRENCH

    公开(公告)号:US20210193658A1

    公开(公告)日:2021-06-24

    申请号:US17124671

    申请日:2020-12-17

    Abstract: An integrated device includes a deep plug. The deep plug is formed by a deep trench extending in a semiconductor body from a shallow surface of a shallow trench isolation. A trench contact makes contact with a conductive filler of the deep trench through the shallow trench at its shallow surface. A system includes at least one integrated device with the deep plug. Moreover, a corresponding process for manufacturing this integrated device includes steps for forming and filling the deep trench before forming the shallow trench isolation and trench window through which the trench contact extends to make contact with the conductive filler. The semiconductor body has a thickness, and the deep trench extends into the semiconductor body less than the thickness.

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