公开(公告)号：US12038471B2

公开(公告)日：2024-07-16

申请号：US17406962

申请日：2021-08-19

Applicant: STMicroelectronics S.r.l.

Inventor： Mirko Dondini ,  Roberto Crisafulli ,  Calogero Andrea Trecarichi ,  Vincenzo Randazzo

IPC: G01R31/28

CPC classification number: G01R31/2843 ,  G01R31/2839

Abstract: An electronic device such as an e-fuse includes analog circuitry configured to be set to one or more self-test configurations. To that effect the device has self-test controller circuitry in turn including: an analog configuration and sensing circuit configured to set the analog circuitry to one or more self-test configurations and to sense test signals occurring in the analog circuitry set to such self-test configurations, a data acquisition circuit configured to acquire and convert to digital the test signals sensed at the analog sensing circuit, and a fault event detection circuit configured to check the test signals converted to digital against reference parameters. The device includes integrated therein a self-test controller configured to control parts or stages of the device to configure circuits, acquire data and control test execution under the coordination of a test sequencer.