公开(公告)号：US08952630B2

公开(公告)日：2015-02-10

申请号：US14049590

申请日：2013-10-09

Applicant: STMicroelectronics S.r.l.

Inventor： Vincenzo Randazzo ,  Giovanni Luca Torrisi ,  Atanasio Labarbera

IPC: H05B37/02 ,  B60Q1/38 ,  B60Q1/34

CPC classification number: B60Q1/38 ,  B60Q1/34 ,  B60Q1/382

Abstract: An electronic system for driving a lamp of a blinker of a vehicle may include a switch having a first input terminal configured to receive a battery voltage, a second input control terminal configured to receive a control signal for operating the switch, and an output terminal. The system may also include a change-over switch configured to connect, alternatively, the output terminal of the switch to the lamp and to a high impedance reference. The system may also include an electronic device connected to the switch and configured to detect a voltage drop between the first input terminal and the output terminal, and, based upon the voltage drop, generate the control signal to have a value to maintain the switch open for a time interval, and generate the control signal to have a second value to maintain the switch closed for another time interval.

Abstract translation: 用于驱动车辆指示灯的灯的电子系统可以包括具有被配置为接收电池电压的第一输入端子的开关，被配置为接收用于操作开关的控制信号的第二输入控制端子和输出端子。 该系统还可以包括转换开关，其被配置为可选地将开关的输出端子连接到灯和高阻抗基准。 该系统还可以包括连接到开关并被配置为检测第一输入端子和输出端子之间的电压降的电子设备，并且基于电压降，产生控制信号以具有保持开关断开的值 并且产生控制信号以具有第二值，以将开关保持另一时间间隔。

公开(公告)号：US12261597B2

公开(公告)日：2025-03-25

申请号：US18321568

申请日：2023-05-22

Applicant: STMicroelectronics S.r.l.

Inventor： Alberto Marzo ,  Vincenzo Randazzo ,  Vanni Poletto ,  Giovanni Susinna

IPC: H03K17/687 ,  H03K17/0412 ,  H03K17/06

Abstract: In embodiments, a capacitance is coupled to a source of electrical charge via a drain to source current flow path through a field-effect transistor. The capacitance is pre-charged by making the field-effect transistor selectively conductive in response to the gate-source voltage of the field-effect transistor exceeding a threshold. The difference between the gate-source voltage of the field-effect transistor and the threshold provides an overdrive value of the field-effect transistor. The gate of the field-effect transistor is driven with a variable gate-source voltage having as a target maintaining a constant overdrive value. Electrical charge is controllably transferred from the source to the capacitance via the drain to source current flow path through the field-effect transistor avoiding undesirably high inrush currents.

公开(公告)号：US20230403005A1

公开(公告)日：2023-12-14

申请号：US18321568

申请日：2023-05-22

Applicant: STMicroelectronics S.r.l.

Inventor： Alberto Marzo ,  Vincenzo Randazzo ,  Vanni Poletto ,  Giovanni Susinna

IPC: H03K17/687 ,  H03K17/0412 ,  H03K17/06

CPC classification number: H03K17/687 ,  H03K17/04123 ,  H03K17/063

Abstract: In embodiments, a capacitance is coupled to a source of electrical charge via a drain to source current flow path through a field-effect transistor. The capacitance is pre-charged by making the field-effect transistor selectively conductive in response to the gate-source voltage of the field-effect transistor exceeding a threshold. The difference between the gate-source voltage of the field-effect transistor and the threshold provides an overdrive value of the field-effect transistor. The gate of the field-effect transistor is driven with a variable gate-source voltage having as a target maintaining a constant overdrive value. Electrical charge is controllably transferred from the source to the capacitance via the drain to source current flow path through the field-effect transistor avoiding undesirably high inrush currents.

公开(公告)号：US12038471B2

公开(公告)日：2024-07-16

申请号：US17406962

申请日：2021-08-19

Applicant: STMicroelectronics S.r.l.

Inventor： Mirko Dondini ,  Roberto Crisafulli ,  Calogero Andrea Trecarichi ,  Vincenzo Randazzo

IPC: G01R31/28

CPC classification number: G01R31/2843 ,  G01R31/2839

Abstract: An electronic device such as an e-fuse includes analog circuitry configured to be set to one or more self-test configurations. To that effect the device has self-test controller circuitry in turn including: an analog configuration and sensing circuit configured to set the analog circuitry to one or more self-test configurations and to sense test signals occurring in the analog circuitry set to such self-test configurations, a data acquisition circuit configured to acquire and convert to digital the test signals sensed at the analog sensing circuit, and a fault event detection circuit configured to check the test signals converted to digital against reference parameters. The device includes integrated therein a self-test controller configured to control parts or stages of the device to configure circuits, acquire data and control test execution under the coordination of a test sequencer.

公开(公告)号：US11764773B2

公开(公告)日：2023-09-19

申请号：US17545719

申请日：2021-12-08

Applicant: STMicroelectronics S.r.l.

Inventor： Enrico Castro ,  Giovanni Susinna ,  Vincenzo Randazzo ,  Mirko Dondini ,  Calogero Andrea Trecarichi

IPC: H03K17/082 ,  H02H9/02

CPC classification number: H03K17/0822 ,  H02H9/02

Abstract: Current absorption management for an electronic fuse coupled between an electrical supply source node and an electrical load node selectively controls a high current electronic switch and a low current electronic switch coupled in parallel between the electrical supply source node and the electrical load node. The high current and low current electronic switches are alternatively actuated: in a first mode where the high current electronic switch is turned on and the low current electronic switch is turned off, and in a second mode where the high current electronic switch is turned off and the low current electronic switch is turned on. Change to the second mode may be made in response to a standby state or a sensing of a lower current in the electrical load. Conversely, change to the first mode may be made in response to a sensing of a higher current in the electrical load.