公开(公告)号：US08650939B2

公开(公告)日：2014-02-18

申请号：US12900867

申请日：2010-10-08

申请人： Sadayuki Matsumiya ,  Yoshiyuki Omori ,  Sadaharu Arita ,  Kotaro Hirano ,  Yasushi Fukumoto ,  Koichi Komatsu ,  Fumihiro Takemura

发明人： Sadayuki Matsumiya ,  Yoshiyuki Omori ,  Sadaharu Arita ,  Kotaro Hirano ,  Yasushi Fukumoto ,  Koichi Komatsu ,  Fumihiro Takemura

IPC分类号： G01B5/20 ,  G01B11/24 ,  G01B21/04

CPC分类号： G01B11/005 ,  G01B5/008 ,  G01B11/245 ,  G01B21/047

摘要： A surface texture measuring machine includes: a stage, a contact-type detector having a stylus, an image probe, a relative movement mechanism and a controller. The controller includes: a center position calculating unit that, when the image probe enters position data of at least three points on a circular contour of a circular concave portion or a circular convex portion of an object, approximates the entered position data to a circle to obtain a center position of the circle; and a stylus setting unit that, after calculating the center position, operates the relative movement mechanism to position the stylus of the contact-type detector at the center position.

摘要翻译： 表面纹理测量机包括：台，具有触针的触点型检测器，图像探针，相对移动机构和控制器。 控制器包括：中心位置计算单元，当图像探测器进入圆形凹部或物体的圆形凸部的圆形轮廓上的至少三个点的位置数据时，将输入的位置数据近似为圆形 获得圆的中心位置; 以及触笔设置单元，其在计算中心位置之后，操作相对移动机构以将接触型检测器的触针定位在中心位置。

公开(公告)号：US08654351B2

公开(公告)日：2014-02-18

申请号：US12900788

申请日：2010-10-08

申请人： Yasushi Fukumoto ,  Koichi Komatsu ,  Fumihiro Takemura ,  Sadaharu Arita ,  Kotaro Hirano

发明人： Yasushi Fukumoto ,  Koichi Komatsu ,  Fumihiro Takemura ,  Sadaharu Arita ,  Kotaro Hirano

IPC分类号： G01B11/30

CPC分类号： G01B5/008 ,  G01B11/005 ,  G01B21/042

摘要： An offset amount calibrating method that obtains the offset amount between a contact-type detector and an image probe for a surface profile measuring machine is provided. The method includes: setting on a stage a calibration jig that has a surface being provided with a lattice pattern with a level difference; measuring the lattice pattern of the calibration jig by the contact-type detector to obtain a first reference position of the lattice pattern; capturing the image of the lattice pattern of the calibration jig by the image probe to obtain a second reference position of the lattice pattern; and obtaining the offset amount from a difference between the first and second reference positions.

摘要翻译： 提供了获得表面轮廓测量机的接触型检测器和图像探针之间的偏移量的偏移量校准方法。 该方法包括：在舞台上设置具有具有水平差的格子图案的表面的校准夹具; 通过接触型检测器测量校准夹具的格子图案，以获得格子图案的第一参考位置; 通过图像探测器捕获校准夹具的格子图案的图像，以获得格子图案的第二参考位置; 以及从所述第一和第二参考位置之间的差获得所述偏移量。

公开(公告)号：USD678787S1

公开(公告)日：2013-03-26

申请号：US29407200

申请日：2011-11-23

申请人： Sadayuki Matsumiya ,  Kotaro Hirano ,  Shigeru Ohtani ,  Kenji Iwamoto

设计人： Sadayuki Matsumiya ,  Kotaro Hirano ,  Shigeru Ohtani ,  Kenji Iwamoto

公开(公告)号：US20090323081A1

公开(公告)日：2009-12-31

申请号：US12457032

申请日：2009-05-29

申请人： Kotaro Hirano ,  Hirofumi Kakiuchi ,  Yoshiyuki Omori

发明人： Kotaro Hirano ,  Hirofumi Kakiuchi ,  Yoshiyuki Omori

IPC分类号： G01B11/24

CPC分类号： G01B5/0004 ,  G01M11/0214 ,  G01M11/025

摘要： A jig for measuring an object shape includes a plate having a first surface and a second surface opposed to the first plate and two reference balls fixed to the plate, each ball surface being exposed on both the first and second surfaces. A reference plane is fixed to the plate, the reference plane having a first plane and a second plane that are parallel to each other, the first and second planes being exposed on the first and second surfaces of the plate, respectively. An object-holding portion is fixed to the plate, the object-holding portion having a hole passing through the plate, the object-holding portion being able to hold an object in the hole with the front and back surfaces of the object being exposed on the first and second surfaces of the plate, respectively.

摘要翻译： 用于测量物体形状的夹具包括具有第一表面和与第一板相对的第二表面的板和固定到板的两个参考球，每个球表面都暴露在第一表面和第二表面上。 参考平面固定到板上，参考平面具有彼此平行的第一平面和第二平面，第一和第二平面分别暴露在板的第一和第二表面上。 物体保持部固定在板上，物体保持部分具有穿过板的孔，物体保持部分能够将物体保持在孔中，使物体的前后表面暴露在孔上 分别是板的第一和第二表面。

公开(公告)号：US07869060B2

公开(公告)日：2011-01-11

申请号：US12457032

申请日：2009-05-29

申请人： Kotaro Hirano ,  Hirofumi Kakiuchi ,  Yoshiyuki Omori

发明人： Kotaro Hirano ,  Hirofumi Kakiuchi ,  Yoshiyuki Omori

IPC分类号： G01B11/24

CPC分类号： G01B5/0004 ,  G01M11/0214 ,  G01M11/025

摘要： A jig for measuring an object shape includes a plate having a first surface and a second surface opposed to the first plate and two reference balls fixed to the plate, each ball surface being exposed on both the first and second surfaces. A reference plane is fixed to the plate, the reference plane having a first plane and a second plane that are parallel to each other, the first and second planes being exposed on the first and second surfaces of the plate, respectively. An object-holding portion is fixed to the plate, the object-holding portion having a hole passing through the plate, the object-holding portion being able to hold an object in the hole with the front and back surfaces of the object being exposed on the first and second surfaces of the plate, respectively.

摘要翻译： 用于测量物体形状的夹具包括具有第一表面和与第一板相对的第二表面的板和固定到板的两个参考球，每个球表面都暴露在第一表面和第二表面上。 参考平面固定到板上，参考平面具有彼此平行的第一平面和第二平面，第一和第二平面分别暴露在板的第一和第二表面上。 物体保持部固定在板上，物体保持部分具有穿过板的孔，物体保持部分能够将物体保持在孔中，使物体的前后表面暴露在孔上 分别是板的第一和第二表面。