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公开(公告)号:US20240268161A1
公开(公告)日:2024-08-08
申请号:US18490891
申请日:2023-10-20
Applicant: Samsung Display Co., LTD.
Inventor: Seung Bo SHIM , Hyo Jung KIM , Ji Hyeon SON , Jeong Yong LEE , Yoo Young PARK , Ji Myoung SEO
IPC: H10K59/123 , H01L29/786 , H10K59/12 , H10K71/16 , H10K71/60
CPC classification number: H10K59/123 , H01L29/7869 , H01L29/78696 , H10K59/1201 , H10K71/166 , H10K71/60
Abstract: A display device includes a first transistor, a pixel electrode electrically connected to the first transistor, and a second transistor electrically connected to the first transistor. A nitrogen content per unit area of an active layer of the second transistor is greater than a nitrogen content per unit area of an active layer of the first transistor.
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公开(公告)号:US20240331615A1
公开(公告)日:2024-10-03
申请号:US18493124
申请日:2023-10-24
Applicant: Samsung Display Co., LTD.
Inventor: Hyo Jung KIM , Seung Bo SHIM , Min Ji BAEK , Hye Sun SUNG , Ji Hyeon SON , Jeong Yong LEE
CPC classification number: G09G3/32 , H01L25/0753 , H01L25/167 , H01L27/1237 , H01L33/382 , H01L33/62 , G09G2320/0247 , G09G2320/0257 , H01L2933/0016
Abstract: A display device includes a first layer disposed on a base layer and including a first gate electrode, a first gate insulating layer, and an active layer, and a second layer disposed on the first layer and including a second gate electrode, a second gate insulating layer, and the active layer. The first layer and the second layer share the active layer. The first gate insulating layer has a first dielectric constant, and the second gate insulating layer has a second dielectric constant. The first dielectric constant and the second dielectric constant are different from each other.
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公开(公告)号:US20240379465A1
公开(公告)日:2024-11-14
申请号:US18532105
申请日:2023-12-07
Applicant: Samsung Display Co., Ltd.
Inventor: Deok Jun CHOI , Hyo Jung KIM , KI YONG PARK , Yoo Young PARK , Hye Sun SUNG , Ji Hyeon SON , Seung Bo SHIM , Jeong Yong LEE
IPC: H01L21/66 , G09G3/3258 , G09G3/3291 , H10K59/12
Abstract: A method includes: forming a MOSFET layer on a semiconductor wafer substrate, the MOSFET layer including: pixel driver circuits; and a display driver circuit; forming at least one line layer on the MOSFET layer; applying a first supply voltage to a first supply voltage line through a first supply voltage pad; connecting data fan-out lines connected to the pixel driver circuits with a first test line by controlling a test switching circuit in the MOSFET layer; measuring an electrical signal generated from each of the pixel driver circuits through a first test pad connected to the first test line; determining whether each of the pixel driver circuits is defective or not based on the measured electrical signal; and forming a light-emitting element layer including light-emitting elements on the at least one line layer when that the pixel driver circuits are determined to be not defective.
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