公开(公告)号：US10317457B2

公开(公告)日：2019-06-11

申请号：US14697075

申请日：2015-04-27

Applicant: Samsung Display Co., Ltd ,  Korea University Research and Business Foundation

Inventor： Jung-Jin Yang ,  Won-Jun Song ,  Mun-Chae Yoon ,  Gyu-Tae Kim ,  Tae-Woong Yoon

IPC: G09G3/32 ,  G01R31/26 ,  H01L51/00

Abstract: A method of inspecting the quality of an organic light-emitting diode (OLED) and an inspecting system for performing the method are disclosed. In one aspect, the method includes applying an input voltage to the OLED, measuring an OLED voltage across the OLED and an OLED current flowing through the OLED, estimating a parameter of the OLED based at least in part on the OLED voltage and the OLED current, and extracting a physical characteristic of the OLED based at least in part on the parameter.

公开(公告)号：US10115365B2

公开(公告)日：2018-10-30

申请号：US15231246

申请日：2016-08-08

Applicant: Samsung Display Co., Ltd.

Inventor： Beom-Jun Kim ,  Myung-Koo Hur ,  Bong-Jun Lee ,  Yeon-Kyu Moon ,  Myung-Sub Lee ,  Gyu-Tae Kim

IPC: G09G3/36 ,  G11C19/28 ,  H03K17/693

Abstract: A gate driving circuit including a plurality of stages connected with each other and configured to output a plurality of gate signals. An n-th (n is a natural number) stage including a gate output part including a first transistor connected between a clock signal and an output node outputting an n-th gate signal, the first transistor having a gate electrode connected to a control node, a carry part connected between the clock signal and a carry node outputting an n-th carry signal, a first node control part connected between the output node and a first low voltage, and a second node control part including at least one transistor connected between the control node and a second low voltage different from the first low voltage.

公开(公告)号：US20160103170A1

公开(公告)日：2016-04-14

申请号：US14697075

申请日：2015-04-27

Applicant: Samsung Display Co., Ltd ,  Korea University Research and Business Foundation

Inventor： Jung-Jin Yang ,  Won-Jun Song ,  Mun-Chae Yoon ,  Gyu-Tae Kim ,  Tae-Woong Yoon

IPC: G01R31/26 ,  H01L51/00

CPC classification number: G01R31/2635 ,  H01L51/0031

Abstract: A method of inspecting the quality of an organic light-emitting diode (OLED) and an inspecting system for performing the method are disclosed. In one aspect, the method includes applying an input voltage to the OLED, measuring an OLED voltage across the OLED and an OLED current flowing through the OLED, estimating a parameter of the OLED based at least in part on the OLED voltage and the OLED current, and extracting a physical characteristic of the OLED based at least in part on the parameter.

Abstract translation: 公开了一种检查有机发光二极管（OLED）的质量的方法和用于执行该方法的检查系统。 在一个方面，该方法包括将输入电压施加到OLED，测量OLED上的OLED电压和流过OLED的OLED电流，至少部分地基于OLED电压和OLED电流来估计OLED的参数 以及至少部分地基于所述参数提取所述OLED的物理特性。