-
1.
公开(公告)号:US20210124679A1
公开(公告)日:2021-04-29
申请号:US17007501
申请日:2020-08-31
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: TAEHYO KIM , DAESEOK BYEON , TAEHONG KWON , CHANHO KIM , TAEYUN LEE
IPC: G06F12/02 , G06F12/123 , G06F12/0811 , G06F12/14 , G11C11/408 , G11C11/4074 , G11C11/4091
Abstract: A memory device comprises a memory cell region including a first metal pad, and a peripheral circuit region including a second metal pad and vertically connected to the memory cell region by the first metal pad and the second metal pad, wherein the memory cell region includes a first memory area having first memory cells storing N-bit data and a second memory area having second memory cells storing M-bit data, where ‘M’ and ‘N’ are natural numbers and M is greater than N, and the peripheral circuit region includes a controller configured to read data stored in the first memory area using a first read operation, read data stored in the second memory area using a second read operation different from the first read operation, and selectively store data in one of the first memory area and the second memory area based on a frequency of use (FOU) of the data.
-
公开(公告)号:US20210066145A1
公开(公告)日:2021-03-04
申请号:US17006186
申请日:2020-08-28
Applicant: Samsung Electronics Co., Ltd.
Inventor: TAEHYO KIM , CHANHO KIM , DAESEOK BYEON
IPC: H01L21/66 , H01L23/00 , H01L27/11573
Abstract: A nonvolatile memory device includes a memory cell region including first pads and a peripheral circuit region including second pads. The regions comprises switches that are electrically connected with the pads, respectively, a test signal generator that generates test signals and to transmit the test signals to the switches, internal circuits that receive first signals through the pads and the switches, to perform operations based on the first signals, and to output second signals through the switches and the pads based on a result of the operations, and a switch controller that controls the switches so that the pads communicate with the test signal generator during a test operation and that the pads communicate with the internal circuits after a completion of the test operation. The peripheral circuit region is vertically connected to the memory cell region by the first metal pads and the second metal pads directly.
-
公开(公告)号:US20190157292A1
公开(公告)日:2019-05-23
申请号:US15996483
申请日:2018-06-03
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: CHANHO KIM , PANSUK KWAK , CHAEHOON KIM , HONGSOO JEON , JEUNGHWAN PARK , BONGSOON LIM
IPC: H01L27/11582 , G11C16/04 , H01L27/1157 , G11C16/24
Abstract: At least one latch of a page buffer of a nonvolatile memory device includes a capacitor that selectively stores a voltage of a sensing node. The capacitor includes at least one first contact having a second height corresponding to a first height of each of cell strings, and at least one second contact to which a ground voltage is supplied. The at least one second contact has a third height corresponding to the first height, disposed adjacent to the at least one first contact, and electrically separated from the at least one first contact.
-
公开(公告)号:US20210066171A1
公开(公告)日:2021-03-04
申请号:US16827746
申请日:2020-03-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: TAEHYO KIM , CHANHO KIM , DAESEOK BYEON
IPC: H01L23/495 , H01L23/538 , H01L23/00
Abstract: A semiconductor die includes first pads, switches that are electrically connected with the first pads, respectively, a test signal generator that generates test signals and to transmit the test signals to the switches, internal circuits that receive first signals through the first pads and the switches, to perform operations based on the first signals, and to output second signals through the switches and the first pads based on a result of the operations, and a switch controller that controls the switches so that the first pads communicate with the test signal generator during a test operation and that the first pads communicate with the internal circuits after a completion of the test operation.
-
公开(公告)号:US20210065799A1
公开(公告)日:2021-03-04
申请号:US16944312
申请日:2020-07-31
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: CHANHO KIM , KYUNGHWA YUN , DAESEOK BYEON
Abstract: A non-volatile memory device includes a memory cell region including a first metal pad and a memory cell array including a plurality of memory cells, and a peripheral circuit region including a second metal pad and vertically connected to the memory cell region. The memory cell region includes a plurality of word lines, a ground selection line in a layer on the word lines, a common source line in a layer on the ground selection line, a plurality of vertical pass transistors in the stair area, and a plurality of driving signal lines in the same layer as the common source line. The word lines form a stair shape in the stair area, and each of the vertical pass transistors is connected between a corresponding one of the word lines and a corresponding one of the driving signal lines.
-
公开(公告)号:US20210066282A1
公开(公告)日:2021-03-04
申请号:US17002149
申请日:2020-08-25
Applicant: Samsung Electronics Co., Ltd.
Inventor: CHANHO KIM , JOO-YONG PARK , DAESEOK BYEON
Abstract: A three-dimensional semiconductor memory device, including a peripheral circuit structure including a first metal pad and a cell array structure disposed on the peripheral circuit structure and including a second metal pad. The peripheral circuit structure may include a first substrate including a first peripheral circuit region and a second peripheral circuit region, first contact plugs, second contact plugs, and a first passive device on and electrically connected to the second contact plugs. The cell array structure may include a second substrate disposed on the peripheral circuit structure, the second substrate including a cell array region and a contact region. The cell array structure may further include gate electrodes and cell contact plugs. The first passive device is vertically between the gate electrodes and the second contact plugs and includes a first contact line. The first metal pad and the second metal pad may be connected by bonding manner.
-
公开(公告)号:US20210066278A1
公开(公告)日:2021-03-04
申请号:US16863736
申请日:2020-04-30
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: CHANHO KIM , KYUNGHWA YUN , DAESEOK BYEON
IPC: H01L25/18 , H01L25/065 , H01L23/00
Abstract: A non-volatile memory device includes a first semiconductor layer having a stair area and a cell area having a memory cell array formed therein, and a second semiconductor layer including a page buffer connected to the memory cell array. The first semiconductor layer includes a plurality of word lines, a ground selection line in a layer on the word lines, a common source line in a layer on the ground selection line, a plurality of vertical pass transistors in the stair area, and a plurality of driving signal lines in the same layer as the common source line. The word lines form a stair shape in the stair area, and each of the vertical pass transistors is connected between a corresponding one of the word lines and a corresponding one of the driving signal lines.
-
公开(公告)号:US20210066277A1
公开(公告)日:2021-03-04
申请号:US16850493
申请日:2020-04-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: CHANHO KIM , JOO-YONG PARK , DAESEOK BYEON
IPC: H01L25/18 , H01L27/11573 , H01L23/528 , H01L23/522 , H01L27/11582 , H01L49/02 , H01L27/11565 , H01L23/00 , H01L27/11575
Abstract: A three-dimensional semiconductor memory device, including a first chip and a second chip stacked on the first chip may be provided. The first chip may include a first substrate including a first peripheral circuit region and a second peripheral circuit region, first contact plugs, and second contact plugs, and a passive device on and electrically connected to the second contact plugs. The second chip may include a second substrate including a cell array region and a contact region, which vertically overlap the second peripheral circuit region and the first peripheral circuit region of the first chip, respectively. The second chip may further include gate electrodes, and cell contact plugs disposed on the contact region of the second substrate and on end portions of the gate electrodes. The first passive device may be vertically between the gate electrodes and the second contact plugs and may include a first contact line.
-
公开(公告)号:US20220139897A1
公开(公告)日:2022-05-05
申请号:US17577647
申请日:2022-01-18
Applicant: Samsung Electronics Co., Ltd.
Inventor: CHANHO KIM , JOO-YONG PARK , DAESEOK BYEON
Abstract: A three-dimensional semiconductor memory device, including a peripheral circuit structure including a first metal pad and a cell array structure disposed on the peripheral circuit structure and including a second metal pad. The peripheral circuit structure may include a first substrate including a first peripheral circuit region and a second peripheral circuit region, first contact plugs, second contact plugs, and a first passive device on and electrically connected to the second contact plugs. The cell array structure may include a second substrate disposed on the peripheral circuit structure, the second substrate including a cell array region and a contact region. The cell array structure may further include gate electrodes and cell contact plugs. The first passive device is vertically between the gate electrodes and the second contact plugs and includes a first contact line. The first metal pad and the second metal pad may be connected by bonding manner.
-
10.
公开(公告)号:US20210124693A1
公开(公告)日:2021-04-29
申请号:US16865580
申请日:2020-05-04
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: TAEHYO KIM , DAESEOK BYEON , TAEHONG KWON , CHANHO KIM , TAEYUN LEE
IPC: G06F12/123 , G06F12/02 , G06F12/14 , G11C11/408 , G11C11/4094 , G11C11/4091
Abstract: A memory device includes; a memory area including a first memory area including first memory cells storing N-bit data and a second memory area including second memory cells storing M-bit data, where ‘M’ and ‘N’ are natural numbers and M is greater than N, and a controller configured to read data stored in the first memory area using a first read operation, read data stored in the second memory area using a second read operation different from the first read operation, and selectively store data in one of the first memory area and the second memory area based on a frequency of use (FOU) of the data.
-
-
-
-
-
-
-
-
-