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公开(公告)号:US12218397B2
公开(公告)日:2025-02-04
申请号:US17769447
申请日:2020-10-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Donggyu Minn , Youngchang Yoon , Daehyun Kang , Kyuhwan An
Abstract: The present disclosure relates to a 5th generation (5G) or pre-5G communication system for supporting a higher data transmission rate than a 4th generation (4G) communication system such as Long-Term Evolution (LTE). The present disclosure provides a device for variable signal attenuation equipped in a stack-up structure inside an RFIC. The device for signal attenuation comprises: a first transmission line positioned on a first layer inside the RFIC; a second transmission line positioned on a second layer, which is adjacent to the first layer, and electromagnetically coupled to the first transmission line; and a control unit. The first transmission line comprises an impedance control unit on one side. The control unit can variably control the impedance control unit.
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公开(公告)号:US11709196B2
公开(公告)日:2023-07-25
申请号:US17378592
申请日:2021-07-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Donggyu Minn , Daehyun Kang , Yonghoon Kim , Jihoon Kim , Hyundo Ryu , Jeeho Park , Sunggi Yang , Youngchang Yoon , Sehyug Jeon
IPC: G01R31/28 , G01R31/3167 , G01R27/32
CPC classification number: G01R31/2822 , G01R27/32 , G01R31/3167
Abstract: The disclosure relates to an RFIC apparatus, and more particularly, to an RFIC circuit having a test circuit, a test apparatus, and a test method thereof. Further, the disclosure relates to a method for estimating or determining a DC gain using a test apparatus and an RF circuit in a DC/AC test stage, and detecting defects of the RF circuit based on the estimated or determined DC gain.
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公开(公告)号:US11010572B2
公开(公告)日:2021-05-18
申请号:US16728651
申请日:2019-12-27
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sangho Lee , Seokhyeon Kim , Donggyu Minn , Youngchang Yoon , Juho Son , Kyuhwan An
IPC: G06K7/10 , G06K19/07 , G06K7/00 , G06K19/077
Abstract: The present disclosure relates to a pre-5th-Generation (5G) or 5G communication system to be provided for supporting higher data rates Beyond 4th-Generation (4G) communication system such as Long Term Evolution (LTE). An electronic device and an operation method thereof are provided for testing performance of a radio frequency integrated circuit (RFIC) in a wireless communication system. The method includes checking a connection state of elements operable as combiners and a plurality of RF chains of the RFIC; performing control to output RF signals from the plurality of RF chains; acquiring an integrated signal by combining the RF signals via the combiners; and determining a quality indicator for the RFIC based the integrated signal.
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公开(公告)号:US11190156B2
公开(公告)日:2021-11-30
申请号:US16740157
申请日:2020-01-10
Applicant: Samsung Electronics Co., Ltd.
Inventor: Youngchang Yoon , Donggyu Minn , Kyuhwan An , Sangho Lee
Abstract: An apparatus including an electronic circuit. The apparatus includes a path unit configured to form a first impedance for controlling a gain of an input signal. The apparatus also includes a shunt unit configured to form a second impedance for performing attenuation between the path unit and a ground, wherein the path unit forms the first impedance using an on-resistance of at least one transistor.
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公开(公告)号:US20200210658A1
公开(公告)日:2020-07-02
申请号:US16728651
申请日:2019-12-27
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sangho Lee , Seokhyeon Kim , Donggyu Minn , Youngchang Yoon , Juho Son , Kyuhwan An
IPC: G06K7/10 , G06K19/07 , G06K19/077 , G06K7/00
Abstract: The present disclosure relates to a pre-5th-Generation (5G) or 5G communication system to be provided for supporting higher data rates Beyond 4th-Generation (4G) communication system such as Long Term Evolution (LTE). An electronic device and an operation method thereof are provided for testing performance of a radio frequency integrated circuit (RFIC) in a wireless communication system. The method includes checking a connection state of elements operable as combiners and a plurality of RF chains of the RFIC; performing control to output RF signals from the plurality of RF chains; acquiring an integrated signal by combining the RF signals via the combiners; and determining a quality indicator for the RFIC based the integrated signal.
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