公开(公告)号：US20180299490A1

公开(公告)日：2018-10-18

申请号：US15706996

申请日：2017-09-18

Applicant: Samsung Electronics Co., Ltd.

Inventor： Yu-Kyum KIM ,  Gyu-Yeol KIM ,  Jae-Won KIM

IPC: G01R1/073 ,  H04N1/32 ,  H04N1/00 ,  G01R1/067

CPC classification number: G01R1/07357 ,  G01R1/06705 ,  G01R1/07314 ,  G01R1/07342 ,  H04N1/00342 ,  H04N1/32138

Abstract: A probe includes a beam and at least two tips. The beam transmits test signals to a device under test (DUT). The at least two tips are arranged on a first end portion of the beam in a direction at a predetermined angle to a length direction of the beam and contacts adjacent terminals of the DUT. The beam has a larger width that exceeds a sum of widths of the at least two tips in a width direction of the beam such that the probe has an improved current carrying capacity and is prevented from being damaged due to overcurrent.