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公开(公告)号:US10664195B2
公开(公告)日:2020-05-26
申请号:US15992230
申请日:2018-05-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hye Ju Kim , Hyo Bong Son , Ml-Hyang Lee
IPC: G06F12/00 , G06F3/06 , G11C11/56 , G11C16/04 , H01L27/11582
Abstract: A memory device, as provided herein, may include an invalidation bit circuit and a cell array. In methods for controlling such memory devices, the invalidation bit circuit may receive an invalid control command from a memory controller to update the invalid bit data to one of first and second states different from each other, the invalidation bit circuit may receive a read control command from the memory controller and may provide an invalid signal when the invalid bit data is in the first state, the invalidation bit circuit may transmit a data request when the invalid bit data is in the second state, and the cell array may receive the data request and provide data.
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公开(公告)号:US20230195344A1
公开(公告)日:2023-06-22
申请号:US17937068
申请日:2022-09-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sun-Mi Yoo , Young-Sik Lee , Jeong-Eun Kim , Hye Ju Kim , So Dam Hwang
CPC classification number: G06F3/064 , G06F3/0607 , G06F3/0658 , G06F3/0679 , G06F12/0253
Abstract: A memory storage device includes a non-volatile memory including a plurality of memory blocks and a memory controller configured to control the non-volatile memory, wherein the memory controller is configured to provide host data including write data to the non-volatile memory, wherein the memory controller is configured to perform a garbage collection operation on the memory blocks to provide garbage collection data to the non-volatile memory when a free block count of the memory blocks is smaller than a first threshold value, and wherein the memory controller is configured to increase a capacity for providing the host data when the free block count of the memory blocks is greater than a second threshold value less than the first threshold value and a valid page count of the first memory block among the memory blocks is less than a third threshold value.
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公开(公告)号:US12056377B2
公开(公告)日:2024-08-06
申请号:US17937068
申请日:2022-09-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sun-Mi Yoo , Young-Sik Lee , Jeong-Eun Kim , Hye Ju Kim , So Dam Hwang
CPC classification number: G06F3/064 , G06F3/0607 , G06F3/0658 , G06F3/0679 , G06F12/0253
Abstract: A memory storage device includes a non-volatile memory including a plurality of memory blocks and a memory controller configured to control the non-volatile memory, wherein the memory controller is configured to provide host data including write data to the non-volatile memory, wherein the memory controller is configured to perform a garbage collection operation on the memory blocks to provide garbage collection data to the non-volatile memory when a free block count of the memory blocks is smaller than a first threshold value, and wherein the memory controller is configured to increase a capacity for providing the host data when the free block count of the memory blocks is greater than a second threshold value less than the first threshold value and a valid page count of the first memory block among the memory blocks is less than a third threshold value.
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