公开(公告)号：US20160139198A1

公开(公告)日：2016-05-19

申请号：US14920252

申请日：2015-10-22

Applicant: Samsung Electronics Co., Ltd.

Inventor： Bo-Seong Park ,  Joo-In Song ,  Min-Woo Kim ,  Hye-ju Kim ,  Chang-Ho Lee ,  Jong-Hwan Lim

IPC: G01R31/28 ,  F24F7/08

CPC classification number: G01R31/2874 ,  G11C29/06 ,  G11C29/56016

Abstract: An apparatus for testing electronic devices may include a test chamber, a heating unit, a cooling unit and a controller. The test chamber may include a plurality of slots configured to receive the electronic devices. The heating unit may heat the electronic devices in the slots. The cooling unit may individually cool the electronic devices in the slots. The controller may selectively control operations of the heating unit and the cooling unit in accordance with temperatures in the slots. Thus, the electronic devices may be provided with a uniform test temperature so that reliability of test results may be improved.

Abstract translation: 用于测试电子设备的设备可以包括测试室，加热单元，冷却单元和控制器。 测试室可以包括被配置为接收电子设备的多个狭槽。 加热单元可以加热槽中的电子设备。 冷却单元可以单独地冷却槽中的电子设备。 控制器可以根据槽中的温度选择性地控制加热单元和冷却单元的操作。 因此，电子设备可以具有均匀的测试温度，从而可以提高测试结果的可靠性。