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公开(公告)号:US10892015B2
公开(公告)日:2021-01-12
申请号:US16822905
申请日:2020-03-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Kang-Bin Lee , Il-Han Park , Jong-Hoo Jo
IPC: G11C16/10 , G11C16/04 , G11C16/26 , G11C16/34 , G11C16/08 , H01L27/11556 , H01L27/11582
Abstract: In a method of programming in a nonvolatile memory device, channels of a plurality of cell strings are precharged through ground selection transistors by a precharge voltage of a source line. A turn-on voltage is applied to a selected ground selection transistor of a selected cell string among the plurality of cell strings, during a verification read period of an N-th program loop. The turn-on voltage applied to the selected ground selection transistor is maintained to precharge the channels for an (N+1)-th program loop, without recovery after the verification read period of the N-th program loop is finished. Power consumption is reduced and an operation speed is increased by maintaining the turn-on voltage of the selected ground selection line to precharge the channels of the cell strings without recovery after the verification read operation is finished.
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公开(公告)号:US20190318784A1
公开(公告)日:2019-10-17
申请号:US16213420
申请日:2018-12-07
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kang-Bin Lee , Il-Han Park , Jong-Hoo Jo
Abstract: In a method of programming in a nonvolatile memory device, channels of a plurality of cell strings are precharged through ground selection transistors by a precharge voltage of a source line. A turn-on voltage is applied to a selected ground selection transistor of a selected cell string among the plurality of cell strings, during a verification read period of an N-th program loop. The turn-on voltage applied to the selected ground selection transistor is maintained to precharge the channels for an (N+1)-th program loop, without recovery after the verification read period of the N-th program loop is finished. Power consumption is reduced and an operation speed is increased by maintaining the turn-on voltage of the selected ground selection line to precharge the channels of the cell strings without recovery after the verification read operation is finished.
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