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公开(公告)号:US20190027491A1
公开(公告)日:2019-01-24
申请号:US15937932
申请日:2018-03-28
Applicant: Samsung Electronics Co., Ltd.
Inventor: KWANG HO LEE , Kwang Ho KIM , Seung Hynu CHO , Ji Hwan YU
IPC: H01L27/11582 , H01L27/11568 , H01L23/528 , H01L29/423 , H01L27/11565 , H01L27/11573
Abstract: A vertical memory device includes a substrate having a cell array region and a connection region adjacent to the cell array region, a plurality of gate electrode layers stacked on the cell array region and the connection region of the substrate, and forming a stepped structure in the connection region, a first metal line dividing the plurality of gate electrode layers and connected to the cell array region and the connection region of the substrate, and a second metal line dividing a portion of the plurality of gate electrode layers and connected to the connection region of the substrate. A depth of a lower end portion of the second metal line may be greater than a depth of a lower end portion of the first metal line in the cell array region, based on an upper surface of the substrate.
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公开(公告)号:US20190214407A1
公开(公告)日:2019-07-11
申请号:US16358182
申请日:2019-03-19
Applicant: SAMSUNG ELECTRONICS CO., LTD
Inventor: KWANG HO LEE , Kwang Ho Kim , Seung-Hyun Cho , Ji Hwan Yu
IPC: H01L27/11582 , H01L27/11565 , H01L29/423 , H01L27/11573 , H01L23/528 , H01L27/11575 , H01L27/1157 , H01L27/11568
CPC classification number: H01L27/11582 , H01L23/528 , H01L27/11565 , H01L27/11568 , H01L27/1157 , H01L27/11573 , H01L27/11575 , H01L29/1037 , H01L29/4234 , H01L29/7889
Abstract: A vertical memory device includes a substrate having a cell array region and a connection region adjacent to the cell array region, a plurality of gate electrode layers stacked on the cell array region and the connection region of the substrate, and forming a stepped structure in the connection region, a first metal line dividing the plurality of gate electrode layers and connected to the cell array region and the connection region of the substrate, and a second metal line dividing a portion of the plurality of gate electrode layers and connected to the connection region of the substrate. A depth of a lower end portion of the second metal line may be greater than a depth of a lower end portion of the first metal line in the cell array region, based on an upper surface of the substrate.
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