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公开(公告)号：US10732219B2
公开(公告)日：2020-08-04
申请号：US15660275
申请日：2017-07-26
Applicant: Samsung Electronics Co., Ltd.
Inventor： Ki Jae Song
Abstract: An apparatus for testing semiconductor devices and a system including the same includes a socket unit having a plurality of sockets into which a plurality of semiconductor devices are inserted, respectively. Also included is a module unit including a first sub-module for receiving a test signal from a host and providing the same test signal to each of the plurality of sockets, and a second sub-module including the same structure as the first sub-module. The first sub-module includes a first buffer unit including an amplifier having an input terminal to which an input signal is inputted and an output terminal to amplify and output the input signal inputted based on a reference voltage (VT), and a reference resistor having one end connected to the input terminal of the amplifier and the other end to which the reference voltage is applied, and a second buffer unit including the same structure as the first buffer unit.
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公开(公告)号：US12287367B2
公开(公告)日：2025-04-29
申请号：US18303845
申请日：2023-04-20
Applicant: Samsung Electronics Co., Ltd.
Inventor： Hyung Il Kim , Joo Sung Yun , Ki Jae Song , Sang Do Han
Abstract: A test board is provided. The test board comprises a first region which includes a first upper surface with first test sockets aligned thereon, and a first lower surface opposite to the first upper surface, a second region which includes a second upper surface with second test sockets aligned thereon, and a second lower surface opposite to the second upper surface, a hinge portion between the first region and the second region, and configured to connect the first region and the second region such that the first region and the second region are folded or unfolded, a first connector at one end of the first region opposite to the hinge portion and a second connector at one end of the second region opposite to the hinge portion.
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公开(公告)号：US10855185B2
公开(公告)日：2020-12-01
申请号：US16394611
申请日：2019-04-25
Applicant: Samsung Electronics Co., Ltd.
Inventor： Ki Jae Song , Jong Woon Yoo
Abstract: A semiconductor circuit includes a reference voltage generating circuit which generates a first reference voltage; a voltage control circuit which receives the first reference voltage from the reference voltage generating circuit to output a second reference voltage; a DC-DC conversion circuit which executes DC-DC conversion on the basis of the second reference voltage which is output from the voltage control circuit, and provides an output thereof to a first node; and a voltage regulator which executes voltage regulating on the basis of the first reference voltage which is output from the reference voltage generating circuit, and a voltage of the first node, and provides an output thereof to a second node.
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