SEMICONDUCTOR MEMORY DEVICES
    1.
    发明公开

    公开(公告)号:US20240324182A1

    公开(公告)日:2024-09-26

    申请号:US18470537

    申请日:2023-09-20

    CPC classification number: H10B12/482 H10B12/0335 H10B12/315

    Abstract: A semiconductor device includes a substrate that includes an active pattern, a bit line structure that crosses the active pattern, a storage node contact electrically connected to the active pattern next to the bit line structure, a spacer structure between a side surface of the bit line structure and the storage node contact, an upper surface of the spacer structure is at a vertical level lower than an upper surface of the bit line structure, an insulating pattern on the spacer structure, and a landing pad structure electrically connected to the storage node contact and on the spacer structure and the bit line structure. The landing pad structure include a first side surface in contact with the spacer structure, a second side surface in contact with the bit line structure, and a third side surface in contact with the insulating pattern.

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