公开(公告)号：US20230378068A1

公开(公告)日：2023-11-23

申请号：US18098986

申请日：2023-01-19

Applicant: Samsung Electronics Co., Ltd.

Inventor： JUNGHOO SHIN ,  SANGHYUN LEE ,  KOUNGMIN RYU ,  JONGMIN BAEK ,  KYUNGYUB JEON ,  KYU-HEE HAN

IPC: H01L23/532 ,  H01L27/092 ,  H01L29/417 ,  H01L29/06 ,  H01L29/423 ,  H01L29/775 ,  H01L23/522

CPC classification number: H01L23/5329 ,  H01L27/092 ,  H01L29/41725 ,  H01L29/0673 ,  H01L29/42392 ,  H01L29/775 ,  H01L23/5226

Abstract: A semiconductor device may include PMOSFET and NMOSFET regions spaced apart from each other on a substrate, first and second active patterns provided on the PMOSFET and NMOSFET regions, respectively, a first channel pattern on the first active pattern, a source/drain pattern electrically connected to the first channel pattern, an active contact electrically connected to the source/drain pattern, the active contact including a first conductive pattern and a first barrier pattern enclosing a portion of a side surface and a bottom surface of the first conductive pattern, a gate electrode extending in a direction crossing the first channel pattern, a gate contact electrically connected to the gate electrode, an air gap provided on the first barrier pattern and between the gate contact and the first conductive pattern, and a lower via provided on the active contact. The lower via may be adjacent to the air gap.

公开(公告)号：US20230027814A1

公开(公告)日：2023-01-26

申请号：US17858372

申请日：2022-07-06

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： LEECHUN KIM ,  KWONYEOL PARK ,  MINWOO PARK ,  SANGHYUN LEE

IPC: H04B7/06 ,  H04W16/28

Abstract: Disclosed are a communication device for performing beamforming and an operating method thereof. The communication device includes: an antenna array configured to simultaneously form a first vertical beam and a second vertical beam for an arbitrary time; a transceiver configured to transmit and receive a signal using a double beam including the first vertical beam and the second vertical beam; and a processor configured to determine a first optimal vertical tilting angle of the first vertical beam based on Inter-Beam Interference (IBI) of the second vertical beam, and determine a second optimal vertical tilting angle of the second vertical beam based on the IBI of the first vertical beam.