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公开(公告)号:US11689224B2
公开(公告)日:2023-06-27
申请号:US17199803
申请日:2021-03-12
Applicant: Samsung Electronics Co., Ltd.
Inventor: Eunae Lee , Kijun Lee , Yeonggeol Song , Myungkyu Lee , Seokha Hwang
CPC classification number: H03M13/1575 , G06F11/1076 , H03M13/1525
Abstract: An error correction device according to the technical idea of the present disclosure includes a syndrome generation circuit configured to receive data and generate a plurality of syndromes for the data, a partial coefficient generation circuit configured to generate partial coefficient information on a part of a coefficient of an error location polynomial by using the data while the plurality of syndromes are generated, an error location determination circuit configured to determine the coefficient of the error location polynomial based on the plurality of syndromes and the partial coefficient information, and obtain a location of an error in the data by using the error location polynomial, and an error correction circuit configured to correct the error in the data according to the location of the error.
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公开(公告)号:US20210384919A1
公开(公告)日:2021-12-09
申请号:US17199803
申请日:2021-03-12
Applicant: Samsung Electronics Co., Ltd.
Inventor: Eunae Lee , Kijun Lee , Yeonggeol Song , Myungkyu Lee , Seokha Hwang
Abstract: An error correction device according to the technical idea of the present disclosure includes a syndrome generation circuit configured to receive data and generate a plurality of syndromes for the data, a partial coefficient generation circuit configured to generate partial coefficient information on a part of a coefficient of an error location polynomial by using the data while the plurality of syndromes are generated, an error location determination circuit configured to determine the coefficient of the error location polynomial based on the plurality of syndromes and the partial coefficient information, and obtain a location of an error in the data by using the error location polynomial, and an error correction circuit configured to correct the error in the data according to the location of the error.
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