公开(公告)号：US20240077535A1

公开(公告)日：2024-03-07

申请号：US18300870

申请日：2023-04-14

Applicant: Samsung Electronics Co., Ltd.

Inventor： Soonil KWON ,  Seongseob SHIN ,  Dongho LEE

IPC: G01R31/319 ,  G01R31/28

CPC classification number: G01R31/31924 ,  G01R31/2834 ,  G01R31/31905

Abstract: Disclosed is a test board which includes a substrate that includes a device under test (DUT) placement area where a first DUT and a second DUT are disposed, a first load switch connected in series with the first DUT and configured to be set to a switch on state or a switch off state based on a first enable signal, a second load switch connected in series with the second DUT and configured to be set to the switch on state or the switch off state depending on a second enable signal, and a test controller. The test controller may be configured to perform a test operation in a (1-1)-th mode by activating the first enable signal and deactivating the second enable signal and then perform the test operation in a (1-2)-th mode by deactivating the first enable signal and activating the second enable signal.