公开(公告)号：US20190019759A1

公开(公告)日：2019-01-17

申请号：US16135234

申请日：2018-09-19

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sang Hoon AHN ,  Tae Soo KIM ,  Jong Min BAEK ,  Woo Kyung YOU ,  Thomas OSZINDA ,  Byung Hee KIM ,  Nae In LEE

IPC: H01L23/532

Abstract: A semiconductor device includes an element layer, a plurality of first interconnect lines on the element layer, a first insulation layer including carbon having a uniform concentration distribution between the first interconnect lines, a plurality of second interconnect lines spaced from the first interconnect lines, and a second insulation layer between the second interconnect lines. An air spacing is included between the second interconnect lines.

公开(公告)号：US20150160137A1

公开(公告)日：2015-06-11

申请号：US14564827

申请日：2014-12-09

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sung Hwa LEE ,  Tae Soo KIM ,  Hyun Soo JANG ,  Jeong Min JO

IPC: G01N21/75

CPC classification number: G01N21/75 ,  G01N21/272 ,  G01N21/5907 ,  G01N21/6408 ,  G01N21/77 ,  G01N21/78 ,  G01N2035/00128

Abstract: An inspection apparatus including a detector configured to emit light to a chamber in which reaction of a sample and a reagent occurs and to detect an optical signal from the chamber, and a controller configured to acquire optical property data based on the detected optical signal and to predict inspection results using the optical property data acquired until a reference point in time.

Abstract translation: 一种检查装置，包括：检测器，被配置为向样本和试剂的反应发生的室发光，并且检测来自所述室的光信号;以及控制器，被配置为基于检测到的光信号获取光学特性数据，以及 使用所获取的光学性质数据预测检查结果，直到参考时间点为止。

公开(公告)号：US20170213786A1

公开(公告)日：2017-07-27

申请号：US15333508

申请日：2016-10-25

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sang Hoon AHN ,  Tae Soo KIM ,  Jong Min BAEK ,  Woo Kyung YOU ,  Thomas OSZINDA ,  Byung Hee KIM ,  Nae In LEE

IPC: H01L23/498 ,  H01L23/535

CPC classification number: H01L23/53295 ,  H01L23/5222 ,  H01L23/53223 ,  H01L23/53238 ,  H01L23/53266 ,  H01L23/5329

Abstract: A semiconductor device includes an element layer, a plurality of first interconnect lines on the element layer, a first insulation layer including carbon having a uniform concentration distribution between the first interconnect lines, a plurality of second interconnect lines spaced from the first interconnect lines, and a second insulation layer between the second interconnect lines. An air spacing is included between the second interconnect lines.

公开(公告)号：US20190029489A1

公开(公告)日：2019-01-31

申请号：US16152733

申请日：2018-10-05

Applicant: Samsung Electronics Co., Ltd.

Inventor： Hwi-Chan JANG ,  Tae Soo KIM ,  Hyun Soo JUNG ,  Sang Hwa CHOI ,  Sang Sik YOON ,  Shin KIM ,  Jin Hee KIM ,  Yeon Kyu JEONG ,  Hak Bong LEE ,  Young Ho KO ,  Kyoung Woung KIM

IPC: A47L11/40 ,  A47L11/33

Abstract: An autonomous cleaner includes a body having a first housing formed at a front and a second housing formed at a rear of the first housing; a brush unit installed at the first housing and configured to sweep and collect dust from a floor; a dust collecting unit installed at the second housing and configured to store the dust inlet into the brush unit; a driving unit to drive the body and coupled to the second housing to be positioned at a lateral side of the dust collecting unit; and a power unit installed at the second housing and coupled to be positioned at a rear of the dust collecting unit. The miniaturization of the autonomous cleaner may be provided while at the same time the capacity of a dust collecting container and the capacity of a battery are increased.