Abstract:
A semiconductor device comprises a metal oxide semiconductor (MOS) transistor circuit configured to receive a body bias voltage, and a negative bias temperature instability compensation (NBTIC) circuit configured to measure a negative bias temperature instability level on the MOS transistor circuit using an operating timing variation measuring unit and to adaptively compensate for a bias according to the measured value.
Abstract:
A voltage generator including an LDO (low dropout) regulator that supplies a current to an internal voltage node of a sense amplification circuit as feedback control based on a voltage level of the internal voltage node; and a power switch circuit including a plurality of power switches each having one end connected to an external voltage and an opposite end connected to the internal voltage node, and that supplies the current to the internal voltage node as feed-forward control based on a known number of sense amplifiers to be activated. The voltage generator may efficiently supply current according to an operation mode of the sense amplification circuit.
Abstract:
A memory device includes a memory cell array which includes a plurality of word lines and a plurality of bit lines; a plurality of column selection lines which extends over the memory cell array and includes a first part of the memory cell array and a second part connected to the first part; a plurality of bit line sense amplifiers each connected to a bit line and configured to sense data stored in a memory cell; a plurality of local sense amplifiers each configured to output the sensed data from one of the bit line sense amplifiers through a column selection transistor connected to a local column selection line; a control logic circuit which generates a row address signal indicating an activation word line and a column address signal indicating an activation bit line; and a column decoder which activates a column selection line based on the column address signal.
Abstract:
A sense amplifier comprises a sense amplifying unit configured to be connected to a bitline and a complimentary bitline of a memory device, to sense a voltage change of the bitline in response to first and second control signals, and to control voltages of a sensing bitline and a complimentary sensing bitline based on the sensed voltage change. It further comprises a first isolation switch configured to connect the bitline with the sensing bitline in response to an isolation signal, a second isolation switch configured to connect the complimentary bitline with the complimentary sensing bitline in response to the isolation signal, a first offset cancellation switch configured to connect the bitline with the sensing bitline in response to an offset cancellation signal, and a second offset cancellation switch configured to connect the complimentary bitline with the complimentary sensing bitline in response to the offset cancellation signal.