公开(公告)号：US12158809B2

公开(公告)日：2024-12-03

申请号：US18295457

申请日：2023-04-04

Applicant: Samsung Electronics Co., Ltd.

Inventor： Ho-Young Lee ,  Sung-Joon Kim ,  Ilho Kim ,  Kyungjin Park ,  Changho Yun ,  Jinhun Jeong ,  Insu Choi ,  Kyung-Hee Han ,  Yukyoung Kim ,  Jinwoo Kim ,  Chaeeun Lee ,  Yunmi Hwang

IPC: G06F11/10 ,  G06F11/07

Abstract: Disclosed is an electronic device including a memory module that includes at least one dynamic random access memory, and a processor configured to access the memory module, determine a corrected error count associated with an address of a corrected error in response to the corrected error being detected when data are read from the memory module, read an error log associated with the corrected error, determine a risk level of the corrected error based on the error log, and schedule a post package repair (PPR) for the address of the corrected error in response to the risk level of the corrected error being high.