公开(公告)号：US10360295B2

公开(公告)日：2019-07-23

申请号：US14181093

申请日：2014-02-14

Applicant: Samsung Electronics Co., Ltd.

Inventor： Chang-Ho Lee

IPC: G06F17/24 ,  G06F17/21 ,  G06F17/20 ,  G06F3/0486 ,  G06F3/0488 ,  H04M1/725

Abstract: A device and a method for editing text in a portable terminal are provided. The device includes displaying content comprising at least one unit of text, receiving an input of at least one unit of text through a first display area, changing to an editing mode for editing the content when the input text is released from the first display area while dragging the input text to replace a specific word included in the content located at a second display area, and replacing the specific word with the input text when the input text is completely dragged to the specific word.

公开(公告)号：US09971748B2

公开(公告)日：2018-05-15

申请号：US14573239

申请日：2014-12-17

Applicant: Samsung Electronics Co., Ltd.

Inventor： Kyung-Tae Kim ,  Yang-Wook Kim ,  Hye-Rim Bae ,  Sun-Key Lee ,  Chang-Hyup Jwa ,  Doo-Suk Kang ,  Chang-Ho Lee ,  Sae-Mee Yim ,  Yong-Joon Jeon

IPC: G06F17/21 ,  G06F17/22

CPC classification number: G06F17/2247 ,  G06F17/212

Abstract: A method is provided comprising: retrieving a markup language file associated with a document, the markup language file including an identifier for retrieving a content item that is part of the document; parsing the markup language file into a first plurality of objects, the first plurality of objects including a first object associated with the content item; assigning a respective layout level to each one of the first plurality of objects; and outputting the document in accordance with a first layout level by: (i) retrieving the content item from a remote source in response to the layout level of the first object matching the first layout level, and (ii) rendering one or more objects from the first plurality based the one or more objects' respective layout levels matching the first layout level.

公开(公告)号：USD706762S1

公开(公告)日：2014-06-10

申请号：US29441179

申请日：2013-01-02

Applicant: Samsung Electronics Co., Ltd.

Designer： Chang-Ho Lee ,  Zi-On Kwon ,  Jochen Backs ,  Won-Suk Chung ,  Han-Kyung Ji

公开(公告)号：US11255904B2

公开(公告)日：2022-02-22

申请号：US17031390

申请日：2020-09-24

Applicant: Samsung Electronics Co., Ltd.

Inventor： Min-Woo Kim ,  Chang-Ho Lee ,  Jin-Ho Choi

IPC: G01R31/28

Abstract: A test system for a memory device includes: a chamber including at least one test socket column having a plurality of test sockets arranged in a first direction, wherein memory devices to be tested are in respective ones of the plurality of test sockets, a temperature adjusting apparatus configured to supply air into the chamber according to a temperature control signal to control a temperature of the chamber, a test device electrically connected to the test sockets and configured to test the memory devices, and a temperature controller configured to receive temperature information of the memory devices from temperature sensors of the memory devices and to output to the temperature adjusting apparatus the temperature control signal to compensate for a temperature difference between a detected temperature of the memory devices and a target temperature.

公开(公告)号：US10816596B2

公开(公告)日：2020-10-27

申请号：US16182148

申请日：2018-11-06

Applicant: Samsung Electronics Co., Ltd.

Inventor： Min-Woo Kim ,  Chang-Ho Lee ,  Jin-Ho Choi

IPC: G01R31/28

Abstract: A test system for a memory device includes: a chamber including at least one test socket column having a plurality of test sockets arranged in a first direction, wherein memory devices to be tested are in respective ones of the plurality of test sockets, a temperature adjusting apparatus configured to supply air into the chamber according to a temperature control signal to control a temperature of the chamber, a test device electrically connected to the test sockets and configured to test the memory devices, and a temperature controller configured to receive temperature information of the memory devices from temperature sensors of the memory devices and to output to the temperature adjusting apparatus the temperature control signal to compensate for a temperature difference between a detected temperature of the memory devices and a target temperature.

公开(公告)号：USD712896S1

公开(公告)日：2014-09-09

申请号：US29441114

申请日：2012-12-31

Applicant: Samsung Electronics Co., Ltd.

Designer： Chang-Ho Lee ,  Zi-On Kwon ,  Jochen Backs ,  Won-Suk Chung ,  Han-Kyung Ji

公开(公告)号：USD709490S1

公开(公告)日：2014-07-22

申请号：US29446927

申请日：2013-02-28

Applicant: Samsung Electronics Co., Ltd.

Designer： Chang-Ho Lee ,  Zi-On Kwon

公开(公告)号：USD707222S1

公开(公告)日：2014-06-17

申请号：US29441112

申请日：2012-12-31

Applicant: Samsung Electronics Co., Ltd.

Designer： Chang-Ho Lee ,  Zi-On Kwon ,  Jochen Backs ,  Won-Suk Chung ,  Han-Kyung Ji

公开(公告)号：USD706766S1

公开(公告)日：2014-06-10

申请号：US29441093

申请日：2012-12-31

Applicant: Samsung Electronics Co., Ltd.

Designer： Chang-Ho Lee ,  Zi-On Kwon ,  Jochen Backs ,  Won-Suk Chung ,  Han-Kyung Ji

公开(公告)号：US20210003632A1

公开(公告)日：2021-01-07

申请号：US17031390

申请日：2020-09-24

Applicant: Samsung Electronics Co., Ltd.

Inventor： Min-Woo Kim ,  Chang-Ho Lee ,  Jin-Ho Choi

IPC: G01R31/28

Abstract: A test system for a memory device includes: a chamber including at least one test socket column having a plurality of test sockets arranged in a first direction, wherein memory devices to be tested are in respective ones of the plurality of test sockets, a temperature adjusting apparatus configured to supply air into the chamber according to a temperature control signal to control a temperature of the chamber, a test device electrically connected to the test sockets and configured to test the memory devices, and a temperature controller configured to receive temperature information of the memory devices from temperature sensors of the memory devices and to output to the temperature adjusting apparatus the temperature control signal to compensate for a temperature difference between a detected temperature of the memory devices and a target temperature.