公开(公告)号：US10564247B2

公开(公告)日：2020-02-18

申请号：US15926818

申请日：2018-03-20

Applicant: Schweitzer Engineering Laboratories, Inc.

Inventor： Armando Guzman-Casillas ,  Mangapathirao Venkata Mynam ,  Taylor Joseph Blanc ,  David E. Whitehead ,  Tony J. Lee ,  Zachary King Sheffield ,  Tracey G. Windley

IPC: G01R35/00 ,  G01R31/28 ,  G01R31/327 ,  G01R31/11 ,  G01R31/08

Abstract: A testing system for imposing a traveling wave signal on an electric power system signal for testing a fault detector is disclosed herein. The testing system may be configured to simulate a fault at a simulated location by controlling the timing of the traveling wave signal. The testing system may be configured to impose multiple traveling wave signals to test the accuracy of the fault location determined by the fault detector. The testing system may be configured with multiple testing apparatuses using time coordination and referenced to an intended fault instant. The testing system may be configured to supply traveling waves of different polarities to test for different fault type detection.

公开(公告)号：US20180210060A1

公开(公告)日：2018-07-26

申请号：US15926818

申请日：2018-03-20

Applicant: Schweitzer Engineering Laboratories, Inc.

Inventor： Armando Guzman-Casillas ,  Mangapathirao Venkata Mynam ,  Taylor Joseph Blanc ,  David E. Whitehead ,  Tony J. Lee ,  Zachary King Sheffield ,  Tracey G. Windley

IPC: G01R35/00

Abstract: A testing system for imposing a traveling wave signal on an electric power system signal for testing a fault detector is disclosed herein. The testing system may be configured to simulate a fault at a simulated location by controlling the timing of the traveling wave signal. The testing system may be configured to impose multiple traveling wave signals to test the accuracy of the fault location determined by the fault detector. The testing system may be configured with multiple testing apparatuses using time coordination and referenced to an intended fault instant. The testing system may be configured to supply traveling waves of different polarities to test for different fault type detection.