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公开(公告)号：US11320475B2
公开(公告)日：2022-05-03
申请号：US16792814
申请日：2020-02-17
Applicant: Schweitzer Engineering Laboratories, Inc.
Inventor： David E. Whitehead , Tony J. Lee , Zachary King Sheffield , Tracey G. Windley
Abstract: A testing apparatus for imposing a traveling wave signal on an electric system signal for testing a fault detector is disclosed herein. The fault detector may be configured to simulate a fault at a particular location by controlling the timing of the traveling wave signal. The testing apparatus may be configured to impose multiple traveling wave signals to test the accuracy of the fault location determined by the fault detector. The testing apparatus may be configured to determine the calculation accuracy of the fault detector. The testing apparatus may impose a traveling wave signal on a signal simulating an electrical signal on an electric power delivery system. The testing apparatus may be used to test capabilities of a fault detector of detecting a fault using traveling waves or incremental quantities.
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公开(公告)号：US10564246B2
公开(公告)日：2020-02-18
申请号：US15293171
申请日：2016-10-13
Applicant: Schweitzer Engineering Laboratories, Inc.
Inventor： David E. Whitehead , Tony J. Lee , Zachary King Sheffield , Tracey G. Windley
IPC: G01R35/00 , G01R31/11 , G01R31/327 , G01R31/08
Abstract: A testing apparatus for imposing a traveling wave signal on an electric system signal for testing a fault detector is disclosed herein. The fault detector may be configured to simulate a fault at a particular location by controlling the timing of the traveling wave signal. The testing apparatus may be configured to impose multiple traveling wave signals to test the accuracy of the fault location determined by the fault detector. The testing apparatus may be configured to determine the calculation accuracy of the fault detector. The testing apparatus may impose a traveling wave signal on a signal simulating an electrical signal on an electric power delivery system. The testing apparatus may be used to test capabilities of a fault detector of detecting a fault using traveling waves or incremental quantities.
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公开(公告)号：US20180210060A1
公开(公告)日：2018-07-26
申请号：US15926818
申请日：2018-03-20
Applicant: Schweitzer Engineering Laboratories, Inc.
Inventor： Armando Guzman-Casillas , Mangapathirao Venkata Mynam , Taylor Joseph Blanc , David E. Whitehead , Tony J. Lee , Zachary King Sheffield , Tracey G. Windley
IPC: G01R35/00
Abstract: A testing system for imposing a traveling wave signal on an electric power system signal for testing a fault detector is disclosed herein. The testing system may be configured to simulate a fault at a simulated location by controlling the timing of the traveling wave signal. The testing system may be configured to impose multiple traveling wave signals to test the accuracy of the fault location determined by the fault detector. The testing system may be configured with multiple testing apparatuses using time coordination and referenced to an intended fault instant. The testing system may be configured to supply traveling waves of different polarities to test for different fault type detection.
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公开(公告)号：US10862298B2
公开(公告)日：2020-12-08
申请号：US15950964
申请日：2018-04-11
Applicant: Schweitzer Engineering Laboratories, Inc.
Inventor： Brian James Peterson , Tracey G. Windley
Abstract: According to various embodiments, an intelligent electronic device IED, such as a protective relay, includes a universal binary input circuit for receiving an AC or DC binary input with a voltage magnitude between approximately 0 Volts and 300 Volts. The universal binary input provides reinforced isolation via an input protection subcircuit and an optocoupler for communicating an optical signal with an electrically isolated controller based on the received binary input signal. In one embodiment, a duty cycle modulation subcircuit generates a pulse width modulated drive signal to drive the optocoupler based on the voltage magnitude of the received binary input. The duty cycle of the pulse width modulated drive signal is (linearly or nonlinearly) inversely proportional to the voltage magnitude of the received binary input.
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公开(公告)号：US20200182956A1
公开(公告)日：2020-06-11
申请号：US16792814
申请日：2020-02-17
Applicant: Schweitzer Engineering Laboratories, Inc.
Inventor： David E. Whitehead , Tony J. Lee , Zachary King Sheffield , Tracey G. Windley
IPC: G01R35/00 , G01R31/08 , G01R31/327 , G01R31/11
Abstract: A testing apparatus for imposing a traveling wave signal on an electric system signal for testing a fault detector is disclosed herein. The fault detector may be configured to simulate a fault at a particular location by controlling the timing of the traveling wave signal. The testing apparatus may be configured to impose multiple traveling wave signals to test the accuracy of the fault location determined by the fault detector. The testing apparatus may be configured to determine the calculation accuracy of the fault detector. The testing apparatus may impose a traveling wave signal on a signal simulating an electrical signal on an electric power delivery system. The testing apparatus may be used to test capabilities of a fault detector of detecting a fault using traveling waves or incremental quantities.
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Patent Agency Ranking
公开(公告)号：US10564247B2
公开(公告)日：2020-02-18
申请号：US15926818
申请日：2018-03-20
Applicant: Schweitzer Engineering Laboratories, Inc.
Inventor： Armando Guzman-Casillas , Mangapathirao Venkata Mynam , Taylor Joseph Blanc , David E. Whitehead , Tony J. Lee , Zachary King Sheffield , Tracey G. Windley
IPC: G01R35/00 , G01R31/28 , G01R31/327 , G01R31/11 , G01R31/08
Abstract: A testing system for imposing a traveling wave signal on an electric power system signal for testing a fault detector is disclosed herein. The testing system may be configured to simulate a fault at a simulated location by controlling the timing of the traveling wave signal. The testing system may be configured to impose multiple traveling wave signals to test the accuracy of the fault location determined by the fault detector. The testing system may be configured with multiple testing apparatuses using time coordination and referenced to an intended fault instant. The testing system may be configured to supply traveling waves of different polarities to test for different fault type detection.
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公开(公告)号：US20170102444A1
公开(公告)日：2017-04-13
申请号：US15293171
申请日：2016-10-13
Applicant: Schweitzer Engineering Laboratories, Inc.
Inventor： David E. Whitehead , Tony J. Lee , Zachary King Sheffield , Tracey G. Windley
CPC classification number: G01R35/00 , G01R31/086 , G01R31/11 , G01R31/3272
Abstract: A testing apparatus for imposing a traveling wave signal on an electric system signal for testing a fault detector is disclosed herein. The fault detector may be configured to simulate a fault at a particular location by controlling the timing of the traveling wave signal. The testing apparatus may be configured to impose multiple traveling wave signals to test the accuracy of the fault location determined by the fault detector. The testing apparatus may be configured to determine the calculation accuracy of the fault detector. The testing apparatus may impose a traveling wave signal on a signal simulating an electrical signal on an electric power delivery system. The testing apparatus may be used to test capabilities of a fault detector of detecting a fault using traveling waves or incremental quantities.
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公开(公告)号：US20190319452A1
公开(公告)日：2019-10-17
申请号：US15950964
申请日：2018-04-11
Applicant: Schweitzer Engineering Laboratories, Inc.
Inventor： Brian James Peterson , Tracey G. Windley
Abstract: According to various embodiments, an intelligent electronic device IED, such as a protective relay, includes a universal binary input circuit for receiving an AC or DC binary input with a voltage magnitude between approximately 0 Volts and 300 Volts. The universal binary input provides reinforced isolation via an input protection subcircuit and an optocoupler for communicating an optical signal with an electrically isolated controller based on the received binary input signal. In one embodiment, a duty cycle modulation subcircuit generates a pulse width modulated drive signal to drive the optocoupler based on the voltage magnitude of the received binary input. The duty cycle of the pulse width modulated drive signal is (linearly or nonlinearly) inversely proportional to the voltage magnitude of the received binary input.
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公开(公告)号：US09843335B2
公开(公告)日：2017-12-12
申请号：US15391521
申请日：2016-12-27
Applicant: Schweitzer Engineering Laboratories, Inc.
CPC classification number: H03M1/0607 , G01R31/086 , H03M1/1023 , H03M1/1076 , H03M1/12 , H03M1/1205
Abstract: The present disclosure pertains to systems and methods for monitoring a plurality of analog-to-digital converters. In one embodiment, a plurality of input channels may each be in communication with a different phase of a three-phase electric power delivery system. The input channels may be configured to receive analog signals from the different phases. A composite signal subsystem may be configured to generate a composite signal based on the plurality of input channels. An analog-to-digital converter subsystem may be configured to produce a digitized representation of each of the plurality of input channels and a digitized representation of the composite signal. An analog-to-digital converter monitor subsystem may identify an error in the analog-to-digital conversion based on the digitized representation of the composite signal and the digitized representations of the plurality of input channels.
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公开(公告)号：US20170187385A1
公开(公告)日：2017-06-29
申请号：US15391521
申请日：2016-12-27
Applicant: Schweitzer Engineering Laboratories, Inc.
CPC classification number: H03M1/0607 , G01R31/086 , H03M1/1023 , H03M1/1076 , H03M1/12 , H03M1/1205
Abstract: The present disclosure pertains to systems and methods for monitoring a plurality of analog-to-digital converters. In one embodiment, a plurality of input channels may each be in communication with a different phase of a three-phase electric power delivery system. The input channels may be configured to receive analog signals from the different phases. A composite signal subsystem may be configured to generate a composite signal based on the plurality of input channels. An analog-to-digital converter subsystem may be configured to produce a digitized representation of each of the plurality of input channels and a digitized representation of the composite signal. An analog-to-digital converter monitor subsystem may identify an error in the analog-to-digital conversion based on the digitized representation of the composite signal and the digitized representations of the plurality of input channels.
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