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公开(公告)号：US20170032809A1
公开(公告)日：2017-02-02
申请号：US15268957
申请日：2016-09-19
Applicant: SEAGATE TECHNOLOGY LLC
Inventor： Ajaykumar Rajasekharan , Gary Kunkel , David J. Ellison , Narayanan Ramakrishnan
CPC classification number: G11B5/4813 , G11B5/6082
Abstract: A slider that includes a leading edge surface; a trailing edge surface; and an air bearing surface (ABS) positioned between the leading edge surface and the trailing edge surface, wherein the trailing edge surface includes a read-write element, at least one low surface energy region and at least one high surface energy region.
Abstract translation: 包括前缘表面的滑块; 后缘表面; 以及位于前缘表面和后缘表面之间的空气轴承表面（ABS），其中后缘表面包括读写元件，至少一个低表面能区域和至少一个高表面能区域。
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公开(公告)号：US11320385B2
公开(公告)日：2022-05-03
申请号：US16161387
申请日：2018-10-16
Applicant: Seagate Technology LLC
Inventor： Kurtis Dean Loken , Zhiyu Chen , Gary Kunkel
Abstract: Various defects in an electronic assembly can be intelligently identified with a system having at least a server connected to a first capture module and a second capture module. The first capture module may be positioned proximal a first manufacturing line while the second capture module is positioned proximal a second manufacturing line. Images can be collected of first and second electronic assemblies by respective first and second capture modules prior to the images being sent to a classification module of the server where at least one defect is automatically detected in each of the first and second electronic assemblies concurrently with the classification module.
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公开(公告)号：US10690697B1
公开(公告)日：2020-06-23
申请号：US16171735
申请日：2018-10-26
Applicant: Seagate Technology LLC
Inventor： Zhiyong Xiao , Gary Kunkel , Dan Dinh
Abstract: An apparatus and method for topographically characterizing a workpiece. The method includes scanning a first surface of a workpiece with a scanning probe at a first resolution to derive a first topographical image, and performing a refining operation on the first topographical image to obtain a true first topographical image. The method also includes scanning, with the scanning probe, a surface of interest of the workpiece, which is a sub-portion of the first surface, at a second resolution that is higher than the first resolution to derive a second topographical image. The second topographical image is scaled down to the first resolution. The method further includes performing a pattern recognition operation to substantially match the scaled-down second topographical image to a corresponding sub-portion of the true first topographical image. The matched sub-portion of the true first topographical image is employed to refine the second topographical image.
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