公开(公告)号：US11320385B2

公开(公告)日：2022-05-03

申请号：US16161387

申请日：2018-10-16

Applicant: Seagate Technology LLC

Inventor： Kurtis Dean Loken ,  Zhiyu Chen ,  Gary Kunkel

IPC: G06K9/00 ,  G01N21/88 ,  G06T7/00

Abstract: Various defects in an electronic assembly can be intelligently identified with a system having at least a server connected to a first capture module and a second capture module. The first capture module may be positioned proximal a first manufacturing line while the second capture module is positioned proximal a second manufacturing line. Images can be collected of first and second electronic assemblies by respective first and second capture modules prior to the images being sent to a classification module of the server where at least one defect is automatically detected in each of the first and second electronic assemblies concurrently with the classification module.

公开(公告)号：US10281268B1

公开(公告)日：2019-05-07

申请号：US15958646

申请日：2018-04-20

Applicant: Seagate Technology LLC

Inventor： Zhiyu Chen ,  Andrew D. Habermas ,  Kurtis Dean Loken ,  Gary J. Kunkel

IPC: G01B11/30 ,  G11B5/60

Abstract: A method includes receiving an image of a surface of a slider bar from an interferometer, where the slider bar includes at least two sliders, and where the image includes image data according to at least two image data channels for a slider bar surface and the at least two sliders. The method also includes generating a slider bar map of the surface of the slider bar based upon the image data of the image, where the slider bar map includes at least two data channels and ascertaining a plurality of individual slider surface maps based on a number of sliders included on the slider bar, where the ascertaining is also based upon the slider bar map having the at least two data channels. The method also includes segmenting the slider bar map according to the plurality of individual slider surface maps.

公开(公告)号：US09995571B1

公开(公告)日：2018-06-12

申请号：US15212874

申请日：2016-07-18

Applicant: Seagate Technology LLC

Inventor： Kurtis Dean Loken ,  Andrew Habermas

IPC: G01B11/24 ,  G01B11/30 ,  H01L21/78

CPC classification number: G01B11/2441 ,  G01B11/306 ,  H01L21/78

Abstract: Measuring surface features of a plurality of sliders including capturing an image of a surface of a slider bar using a large aperture interferometer, where the slider bar includes at least one slider of the plurality of sliders, and where the image includes surface height data for the slider bar surface and the included at least one slider. A bar height map is created of the slider bar based upon the surface height data of the captured image. Individual slider surfaces having individual slider height maps are identified, based at least in part of the number of sliders included on the slider bar.