公开(公告)号：US20080110809A1

公开(公告)日：2008-05-15

申请号：US11983635

申请日：2007-11-09

申请人： Seong-goo Kang ,  Jun-ho Lee ,  Ki-sang Kang ,  Hyun-seop Shim ,  Do-young Kam ,  Jae-il Lee ,  Ju-il Kang

发明人： Seong-goo Kang ,  Jun-ho Lee ,  Ki-sang Kang ,  Hyun-seop Shim ,  Do-young Kam ,  Jae-il Lee ,  Ju-il Kang

IPC分类号： G01R31/28 ,  B07C5/344 ,  G01R31/319 ,  B65G65/02

CPC分类号： H01L21/67282 ,  G01R31/2867 ,  G01R31/2893 ,  H01L21/67271 ,  Y10S414/135

摘要： A multifunctional handler system for electrical testing of semiconductor devices is provided. The multifunctional handler system comprises: (1) a semiconductor device processing section comprising a loading unit including a buffer, a sorting unit including a separate marking machine, and a unloading unit; (2) a semiconductor device testing section, separate from the semiconductor device processing section, comprises a test chamber, the test chamber is separated into two or more test spaces, and the test spaces of the test chamber include a second chamber positioned at a lower position, a first chamber positioned above the second chamber, and pipelines for connecting the first and second chambers to each other; and (3) a host computer which is independently connected to the semiconductor device processing section and the semiconductor device testing section and controls tray information, test results, marking information, and test program information.

摘要翻译： 提供了一种用于半导体器件的电测试的多功能处理器系统。 多功能处理器系统包括：（1）半导体器件处理部分，包括包括缓冲器的加载单元，包括单独的标记机的分拣单元和卸载单元; （2）与半导体器件处理部分分离的半导体器件测试部分包括测试室，测试室被分离成两个或更多个测试空间，并且测试室的测试空间包括位于下部的第二室 位置，位于第二室上方的第一室以及用于将第一和第二室彼此连接的管道; 和（3）独立地连接到半导体器件处理部分和半导体器件测试部分并且控制托盘信息，测试结果，标记信息和测试程序信息的主计算机。

公开(公告)号：US20070236235A1

公开(公告)日：2007-10-11

申请号：US11727938

申请日：2007-03-29

申请人： Seong-goo Kang ,  Jun-ho Lee ,  Ki-sang Kang ,  Hyun-seop Shim ,  Do-young Kam ,  Jae-il Lee ,  Ju-il Kang

发明人： Seong-goo Kang ,  Jun-ho Lee ,  Ki-sang Kang ,  Hyun-seop Shim ,  Do-young Kam ,  Jae-il Lee ,  Ju-il Kang

IPC分类号： G01R31/02

CPC分类号： G01R31/2865 ,  G01R31/2862

摘要： A semiconductor device test handler for maintaining stable temperature in a test environment may include a loading unit that loads a plurality of semiconductor devices mounted on a test tray; a soak chamber configured to receive the test tray from the loading unit and to age the semiconductor devices at an aging temperature; and a test chamber configured to receive and test the aged semiconductor devices. The test chamber may include: a test board; a first chamber; a second chamber; one or more pipelines connected to the first and second chambers that allow a temperature-control medium to flow between the first and second chambers; a de-soak chamber that further ages the tested semiconductor devices so that the tested semiconductor devices substantially return to ambient temperature; and a sorting and unloading unit that sorts the tested semiconductor devices according to results of the test and that unloads the sorted semiconductor devices.

摘要翻译： 用于在测试环境中保持稳定温度的半导体器件测试处理器可以包括加载单元，其加载安装在测试托盘上的多个半导体器件; 浸泡室，其构造成从加载单元接收测试托盘并在老化温度下老化半导体器件; 以及被配置为接收和测试老化的半导体器件的测试室。 测试室可以包括：测试板; 第一个房间 第二个房间 连接到第一和第二室的一个或多个管道，允许温度控制介质在第一和第二室之间流动; 脱泡室，其进一步老化测试的半导体器件，使得测试的半导体器件基本上回到环境温度; 以及分类和卸载单元，其根据测试结果对测试的半导体器件进行排序，并且对排序的半导体器件进行卸载。

公开(公告)号：US07838790B2

公开(公告)日：2010-11-23

申请号：US11983635

申请日：2007-11-09

申请人： Seong-goo Kang ,  Jun-ho Lee ,  Ki-sang Kang ,  Hyun-seop Shim ,  Do-young Kam ,  Jae-il Lee ,  Ju-il Kang

发明人： Seong-goo Kang ,  Jun-ho Lee ,  Ki-sang Kang ,  Hyun-seop Shim ,  Do-young Kam ,  Jae-il Lee ,  Ju-il Kang

IPC分类号： B07C5/34

CPC分类号： H01L21/67282 ,  G01R31/2867 ,  G01R31/2893 ,  H01L21/67271 ,  Y10S414/135

摘要： A multifunctional handler system for electrical testing of semiconductor devices is provided. The multifunctional handler system comprises: (1) a semiconductor device processing section comprising a loading unit including a buffer, a sorting unit including a separate marking machine, and a unloading unit; (2) a semiconductor device testing section, separate from the semiconductor device processing section, comprises a test chamber, the test chamber is separated into two or more test spaces, and the test spaces of the test chamber include a second chamber positioned at a lower position, a first chamber positioned above the second chamber, and pipelines for connecting the first and second chambers to each other; and (3) a host computer which is independently connected to the semiconductor device processing section and the semiconductor device testing section and controls tray information, test results, marking information, and test program information.

摘要翻译： 提供了一种用于半导体器件的电测试的多功能处理器系统。 多功能处理器系统包括：（1）半导体器件处理部分，包括包括缓冲器的加载单元，包括单独的标记机的分拣单元和卸载单元; （2）与半导体器件处理部分分离的半导体器件测试部分包括测试室，测试室被分离成两个或更多个测试空间，并且测试室的测试空间包括位于下部的第二室 位置，位于第二室上方的第一室以及用于将第一和第二室彼此连接的管道; 和（3）独立地连接到半导体器件处理部分和半导体器件测试部分并且控制托盘信息，测试结果，标记信息和测试程序信息的主计算机。

公开(公告)号：US07554349B2

公开(公告)日：2009-06-30

申请号：US11727938

申请日：2007-03-29

申请人： Seong-goo Kang ,  Jun-ho Lee ,  Ki-sang Kang ,  Hyun-seop Shim ,  Do-young Kam ,  Jae-il Lee ,  Ju-il Kang

发明人： Seong-goo Kang ,  Jun-ho Lee ,  Ki-sang Kang ,  Hyun-seop Shim ,  Do-young Kam ,  Jae-il Lee ,  Ju-il Kang

IPC分类号： G01R31/02

CPC分类号： G01R31/2865 ,  G01R31/2862

摘要： A semiconductor device test handler for maintaining stable temperature in a test environment may include a loading unit that loads a plurality of semiconductor devices mounted on a test tray; a soak chamber configured to receive the test tray from the loading unit and to age the semiconductor devices at an aging temperature; and a test chamber configured to receive and test the aged semiconductor devices. The test chamber may include: a test board; a first chamber; a second chamber; one or more pipelines connected to the first and second chambers that allow a temperature-control medium to flow between the first and second chambers; a de-soak chamber that further ages the tested semiconductor devices so that the tested semiconductor devices substantially return to ambient temperature; and a sorting and unloading unit that sorts the tested semiconductor devices according to results of the test and that unloads the sorted semiconductor devices.

摘要翻译： 用于在测试环境中保持稳定温度的半导体器件测试处理器可以包括加载单元，其加载安装在测试托盘上的多个半导体器件; 浸泡室，其构造成从加载单元接收测试托盘并在老化温度下老化半导体器件; 以及被配置为接收和测试老化的半导体器件的测试室。 测试室可以包括：测试板; 第一个房间 第二个房间 连接到第一和第二室的一个或多个管道，允许温度控制介质在第一和第二室之间流动; 脱泡室，其进一步老化测试的半导体器件，使得测试的半导体器件基本上回到环境温度; 以及分类和卸载单元，其根据测试结果对测试的半导体器件进行排序，并且对排序的半导体器件进行卸载。

公开(公告)号：US06462534B2

公开(公告)日：2002-10-08

申请号：US09805212

申请日：2001-03-14

申请人： Seong-goo Kang ,  Byoung-jun Min ,  Hyo-geun Chae ,  Jeong-ho Bang

发明人： Seong-goo Kang ,  Byoung-jun Min ,  Hyo-geun Chae ,  Jeong-ho Bang

IPC分类号： G01R3102

CPC分类号： G01R31/2867 ,  G01R1/0408 ,  H01L2224/75 ,  H01L2224/81

摘要： A loader of semiconductor package burn-in test equipment allows a test socket to be commonly used for semiconductor packages of all sizes. The loader includes a vacuum suction head for picking semiconductor packages to be tested, and a package guider for ensuring that semiconductor packages of any size will be aligned with the test socket. As the semiconductor package is positioned over the test socket by the vacuum suction head of the loader, guide surfaces of the package guider are brought inwardly into guide positions at which the surfaces extend just beneath the vacuum suction head. Any semiconductor package that is not in alignment with the test socket while being held by the vacuum suction head is guided by the guides surfaces into alignment once the vacuum suction is turned off and the package falls from the vacuum suction head. Thus, the package guider serves as an adaptor, eliminating the need for several test sockets having respective adaptors for different sizes of semiconductor packages.

摘要翻译： 半导体封装老化测试设备的装载机允许测试插座常用于各种尺寸的半导体封装。 装载机包括用于拾取待测试的半导体封装的真空吸头，以及用于确保任何尺寸的半导体封装将与测试插座对准的封装导向器。 当半导体封装通过装载机的真空吸头位于测试插座上方时，封装引导件的引导表面向内进入引导位置，在该位置处表面正好在真空抽吸头的正下方延伸。 在真空抽吸被关闭并且包装从真空抽吸头落下的情况下，由真空吸头保持的不与测试插座对准的任何半导体封装被引导面对引导。 因此，封装导向器用作适配器，消除了对具有用于不同尺寸的半导体封装的相应适配器的多个测试插座的需要。