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公开(公告)号：US07952435B2
公开(公告)日：2011-05-31
申请号：US11976912
申请日：2007-10-29
申请人： Seung-Wook Lee , Joonbac Park , Jeong Woo Lee , Su Won Kang , Kyeongho Lee
发明人： Seung-Wook Lee , Joonbac Park , Jeong Woo Lee , Su Won Kang , Kyeongho Lee
IPC分类号： H03L7/00
摘要： Embodiments of a phase lock loop and a method for compensating a temperature thereof can output an initial tuning digital value for a voltage controlled oscillator configured to output a desired phase lock loop frequency compensated according to a temperature change. Embodiments of a phase lock loop and a method for compensating a temperature thereof can simultaneously perform a digital coarse tuning and an analog fine tuning to compensate for a temperature in a limited time.
摘要翻译： 锁相环的实施例和用于补偿其温度的方法可以输出用于输出根据温度变化补偿的期望锁相环的压控振荡器的初始调谐数字值。 锁相环的实施例和用于补偿其温度的方法可以同时进行数字粗调和模拟微调以在有限的时间内补偿温度。
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公开(公告)号：US20080252383A1
公开(公告)日：2008-10-16
申请号：US11976912
申请日：2007-10-29
申请人： Seung Wook Lee , Joonbac Park , Jeong Woo Lee , Su Won Kang , Kyeongho Lee
发明人： Seung Wook Lee , Joonbac Park , Jeong Woo Lee , Su Won Kang , Kyeongho Lee
IPC分类号： H03L7/10
摘要： Embodiments of a phase lock loop and a method for compensating a temperature thereof can output an initial tuning digital value for a voltage controlled oscillator configured to output a desired phase lock loop frequency compensated according to a temperature change. Embodiments of a phase lock loop and a method for compensating a temperature thereof can simultaneously perform a digital coarse tuning and an analog fine tuning to compensate for a temperature in a limited time.
摘要翻译： 锁相环的实施例和用于补偿其温度的方法可以输出用于输出根据温度变化补偿的期望锁相环的压控振荡器的初始调谐数字值。 锁相环的实施例和用于补偿其温度的方法可以同时进行数字粗调和模拟微调以在有限的时间内补偿温度。
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3.发明授权OFDM receiving circuit having multiple demodulation paths using oversampling analog-to-digital converter 有权OFDM接收电路具有使用过采样模数转换器的多个解调路径公开(公告)号：US08243579B2
公开(公告)日：2012-08-14
申请号：US11976909
申请日：2007-10-29
申请人： Seung-Wook Lee , Joonbae Park , Jeong Woo Lee , Su Won Kang , Kyeongho Lee
发明人： Seung-Wook Lee , Joonbae Park , Jeong Woo Lee , Su Won Kang , Kyeongho Lee
IPC分类号： H04J11/00
CPC分类号： H04L27/2647
摘要： Embodiments according to the application relates to an OFDM (orthogonal frequency division multiplexing) receiving circuit and methods thereof configured to have a plurality of demodulation paths for an oversampling ADC, which can increase or improve an overall performance of the circuit.
摘要翻译： 根据本申请的实施例涉及一种OFDM（正交频分复用）接收电路及其方法，被配置为具有用于过采样ADC的多个解调路径，其可以增加或提高电路的整体性能。
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4.发明申请OFDM receiving circuit having multiple demodulation paths using oversampling analog-to-digital converter 有权OFDM接收电路具有使用过采样模数转换器的多个解调路径公开(公告)号：US20080253277A1
公开(公告)日：2008-10-16
申请号：US11976909
申请日：2007-10-29
申请人： Seung Wook Lee , Joonbae Park , Jeong Woo Lee , Su Won Kang , Kyeongho Lee
发明人： Seung Wook Lee , Joonbae Park , Jeong Woo Lee , Su Won Kang , Kyeongho Lee
IPC分类号： H04J11/00
CPC分类号： H04L27/2647
摘要： Embodiments according to the application relates to an OFDM (orthogonal frequency division multiplexing) receiving circuit and methods thereof configured to have a plurality of demodulation paths for an oversampling ADC, which can increase or improve an overall performance of the circuit.
摘要翻译： 根据本申请的实施例涉及一种OFDM（正交频分复用）接收电路及其方法，被配置为具有用于过采样ADC的多个解调路径，其可以增加或提高电路的整体性能。
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公开(公告)号：US20080253470A1
公开(公告)日：2008-10-16
申请号：US11976910
申请日：2007-10-29
申请人： Seung Wook Lee , Joonbae Park , Jeong Woo Lee , Su Won Kang , Kyeongho Lee
发明人： Seung Wook Lee , Joonbae Park , Jeong Woo Lee , Su Won Kang , Kyeongho Lee
IPC分类号： H04L27/28
CPC分类号： H04L27/2649
摘要： Embodiments according to the application relate to an OFDM (orthogonal frequency division multiplexing) receiving circuit and methods thereof configured to have a plurality of demodulation paths, which can increase or improve a performance of an ADC and/or a filter.
摘要翻译： 根据本申请的实施例涉及OFDM（正交频分复用）接收电路及其配置为具有多个解调路径的方法，其可以增加或改善ADC和/或滤波器的性能。
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公开(公告)号：US07995645B2
公开(公告)日：2011-08-09
申请号：US12027762
申请日：2008-02-07
申请人： Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
发明人： Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
IPC分类号： H04B3/46
CPC分类号： H03D7/166 , H03D3/009 , H04L25/061 , H04L27/364 , H04L27/3863 , H04L2027/0016
摘要： The present general inventive concept relates to apparatuses and/or methods for measuring an in-phase and quadrature (IQ) imbalance. In one embodiment, a signal generator can provide a first IQ signal of a DC component during a first period and the first IQ signal of a first angular frequency during a second period, an IQ up-conversion mixer can up-convert the first IQ signal by a second angular frequency during the first period and up-convert the first IQ signal by a third angular frequency during the second period to output a second IQ signal, an IQ down-conversion mixer can down-convert the second IQ signal by the third angular frequency to output a third IQ signal and an IQ imbalance detector can obtain a first IQ imbalance (e.g., Rx IQ imbalance) from the third IQ signal during the first period and a second IQ imbalance (e.g., Tx/Rx IQ imbalance) during the second period.
摘要翻译： 本总体发明构思涉及用于测量同相和正交（IQ）不平衡的装置和/或方法。 在一个实施例中，信号发生器可以在第一周期期间提供DC分量的第一IQ信号，并且在第二周期期间提供第一角频率的第一IQ信号，IQ上变频混频器可以上变频第一IQ信号 在第一周期期间以第二角度频率进行第二角度频率，并且在第二周期期间将第一IQ信号上升转换第三角度频率以输出第二IQ信号，IQ降频转换混频器可以将第二IQ信号下变频第三IQ信号 输出第三IQ信号和IQ不平衡检测器的角频率可以在第一周期期间从第三IQ信号和第二IQ不平衡（例如，Tx / Rx IQ不平衡）获得第一IQ不平衡（例如，Rx IQ不平衡） 第二期。
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公开(公告)号：US20080212662A1
公开(公告)日：2008-09-04
申请号：US12027762
申请日：2008-02-07
申请人： Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
发明人： Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
CPC分类号： H03D7/166 , H03D3/009 , H04L25/061 , H04L27/364 , H04L27/3863 , H04L2027/0016
摘要： The present general inventive concept relates to apparatuses and/or methods for measuring an IQ imbalance. In one embodiment, a signal generator can provide a first IQ signal of a DC component during a first period and the first IQ signal of a first angular frequency during a second period, an IQ up-conversion mixer can up-convert the first IQ signal by a second angular frequency during the first period and up-convert the first IQ signal by a third angular frequency during the second period to output a second IQ signal, an IQ down-conversion mixer can down-convert the second IQ signal by the third angular frequency to output a third IQ signal and an IQ imbalance detector can obtain a first IQ imbalance (e.g., Rx IQ imbalance) from the third IQ signal during the first period and a second IQ imbalance (e.g., Tx/Rx IQ imbalance) during the second period.
摘要翻译： 本发明总体构思涉及用于测量IQ不平衡的装置和/或方法。 在一个实施例中，信号发生器可以在第一周期期间提供DC分量的第一IQ信号，并且在第二周期期间提供第一角频率的第一IQ信号，IQ上变频混频器可以上变频第一IQ信号 在第一周期期间以第二角度频率进行第二角度频率，并且在第二周期期间将第一IQ信号上升转换第三角度频率以输出第二IQ信号，IQ降频转换混频器可以将第二IQ信号下变频第三IQ信号 输出第三IQ信号和IQ不平衡检测器的角频率可以在第一周期期间从第三IQ信号和第二IQ不平衡（例如，Tx / Rx IQ不平衡）获得第一IQ不平衡（例如，Rx IQ不平衡） 第二期。
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公开(公告)号：US08229028B2
公开(公告)日：2012-07-24
申请号：US12034627
申请日：2008-02-20
申请人： Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
发明人： Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
IPC分类号： H04K1/02
CPC分类号： H04L27/3863 , H04L27/364
摘要： The present invention relates to an apparatus and a method for measuring an in phase and quadrature (IQ) imbalance. One embodiment according to the present general inventive concept can provide a method for measuring a Tx IQ imbalance generated in an IQ up-conversion mixer and an Rx IQ imbalance generated in an IQ down-conversion mixer, that includes measuring a first IQ imbalance corresponding to a first combination of the Rx IQ imbalance with the Tx IQ imbalance, measuring a second IQ imbalance corresponding to a second combination of the Rx IQ imbalance with the Tx IQ imbalance and obtaining the Tx IQ imbalance and the Rx IQ imbalance from the first IQ imbalance and the second IQ imbalance.
摘要翻译： 本发明涉及用于测量同相和正交（IQ）不平衡的装置和方法。 根据本发明总体构思的一个实施例可以提供一种用于测量在IQ上变频混频器中产生的Tx IQ不平衡和在IQ下变频混频器中产生的Rx IQ不平衡的方法，其包括测量对应于 Rx IQ不平衡与Tx IQ不平衡的第一组合，测量对应于Rx IQ不平衡与Tx IQ不平衡的第二组合的第二IQ不平衡，并且从第一IQ不平衡获得Tx IQ不平衡和Rx IQ不平衡 和第二个智商不平衡。
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公开(公告)号：US08018990B2
公开(公告)日：2011-09-13
申请号：US12027742
申请日：2008-02-07
申请人： Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
发明人： Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
IPC分类号： H04B3/46
CPC分类号： H04L27/364 , H04L27/3863
摘要： The present general inventive concept relates to apparatuses and/or methods for measuring an in-phase and quadrature (IQ) imbalance. In one embodiment, a detector can measure an error caused by an IQ imbalance using a first IQ signal including a desired signal and a corresponding image signal by the IQ imbalance. The detector can include a derotator to derotate the first IQ signal by a first angular frequency to obtain a second IQ signal and derotate the first IQ signal by a second angular frequency to obtain a third IQ signal, a DC estimator to obtain a fourth IQ signal corresponding to a DC component of the second IQ signal and a fifth IQ signal corresponding to a DC component of the third IQ signal and a controller can determine a gain error or a phase error from the fourth IQ signal and the fifth IQ signal.
摘要翻译： 本总体发明构思涉及用于测量同相和正交（IQ）不平衡的装置和/或方法。 在一个实施例中，检测器可以通过IQ不平衡来使用包括期望信号和对应图像信号的第一IQ信号来测量由IQ不平衡引起的误差。 检测器可以包括解旋器，以将第一IQ信号扭转第一角度频率以获得第二IQ信号并且将第一IQ信号解旋第二角频率以获得第三IQ信号，DC估计器以获得第四IQ信号 对应于第二IQ信号的DC分量和对应于第三IQ信号的DC分量的第五IQ信号，并且控制器可以从第四IQ信号和第五IQ信号确定增益误差或相位误差。
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公开(公告)号：US20080205502A1
公开(公告)日：2008-08-28
申请号：US12027742
申请日：2008-02-07
申请人： Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
发明人： Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
CPC分类号： H04L27/364 , H04L27/3863
摘要： The present general inventive concept relates to apparatuses and/or methods for measuring an IQ imbalance. In one embodiment, a detector can measure an error caused by an IQ imbalance using a first IQ signal including a desired signal and a corresponding image signal by the IQ imbalance. The detector can include a derotator to derotate the first IQ signal by a first angular frequency to obtain a second IQ signal and derotate the first IQ signal by a second angular frequency to obtain a third IQ signal, a DC estimator to obtain a fourth IQ signal corresponding to a DC component of the second IQ signal and a fifth IQ signal corresponding to a DC component of the third IQ signal and a controller can determine a gain error or a phase error from the fourth IQ signal and the fifth IQ signal.
摘要翻译： 本发明总体构思涉及用于测量IQ不平衡的装置和/或方法。 在一个实施例中，检测器可以通过IQ不平衡来使用包括期望信号和对应图像信号的第一IQ信号来测量由IQ不平衡引起的误差。 检测器可以包括解旋器，以将第一IQ信号扭转第一角度频率以获得第二IQ信号并且将第一IQ信号解旋第二角频率以获得第三IQ信号，DC估计器以获得第四IQ信号 对应于第二IQ信号的DC分量和对应于第三IQ信号的DC分量的第五IQ信号，并且控制器可以从第四IQ信号和第五IQ信号确定增益误差或相位误差。
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