专利检索 ap:("Sheldon Xiangdong Tan" OR "Kai He" OR "Xin Huang") AND inv:"Sheldon Xiangdong Tan" 第 1 页

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发明申请
ON-CHIP AGING SENSOR AND COUNTERFEIT INTEGRATED CIRCUIT DETECTION METHOD 审中-公开

公开(公告)号：US20170126229A1

公开(公告)日：2017-05-04

申请号：US15338170

申请日：2016-10-28

申请人： Sheldon Xiangdong Tan , Kai He , Xin Huang

发明人： Sheldon Xiangdong Tan , Kai He , Xin Huang

IPC分类号： H03K19/003 , H01L23/525 , G01R31/28 , G11C17/18

CPC分类号： H03K19/003 , G01R31/2858 , G01R31/44 , G11C5/005 , G11C17/18 , G11C29/022 , G11C29/025 , G11C29/1201 , G11C29/12015 , G11C2029/4402 , H01L23/5252

摘要： An on-chip aging sensor and associated methods for detecting counterfeit integrated circuits are shown. In one example, the on-chip aging sensor is integrated within a chip. In one example, the on-chip sensor includes both an on-chip age sensor, and an antifuse memory block including static information unique to the chip.