Method of Fabricating an Integrated Device
    1.
    发明申请
    Method of Fabricating an Integrated Device 有权
    制造集成装置的方法

    公开(公告)号:US20130034958A1

    公开(公告)日:2013-02-07

    申请号:US13648932

    申请日:2012-10-10

    Abstract: A method of fabricating an integrated device including a MicroElectroMechanical system (MEMS) and an associated microcircuit is provided. In one embodiment, the method comprises: forming a high temperature contact through a dielectric layer to an underlying element of a microcircuit formed adjacent to a MicroElectroMechanical System (MEMS) structure on a substrate; and depositing a layer of conducting material over the dielectric layer, and patterning the layer of conducting material to form a local interconnect (LI) for the microcircuit overlying and electrically coupled to the contact and a bottom electrode for the adjacent MEMS structure. Other embodiments are also provided.

    Abstract translation: 提供了一种制造包括微电子机械系统(MEMS)和相关微电路的集成装置的方法。 在一个实施例中,该方法包括:通过电介质层形成高温接触到邻近微电子机械系统(MEMS)结构的衬底上形成的微电路的下层元件; 以及在所述电介质层上沉积导电材料层,以及图案化所述导电材料层以形成用于所述微电路的局部互连(L1),所述微电路覆盖并电耦合到所述触点和所述相邻MEMS结构的底部电极。 还提供了其他实施例。

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