公开(公告)号：US20100194399A1

公开(公告)日：2010-08-05

申请号：US12690656

申请日：2010-01-20

申请人： Soo-Haeng Cho ,  Ki-Jae Song ,  Sung-dong Suh ,  Kyoung-ho Ha ,  Seong-gu Kim ,  Yeoung-Kum Kim ,  In-sung Joe

发明人： Soo-Haeng Cho ,  Ki-Jae Song ,  Sung-dong Suh ,  Kyoung-ho Ha ,  Seong-gu Kim ,  Yeoung-Kum Kim ,  In-sung Joe

IPC分类号： G01R31/00 ,  G01R31/26

CPC分类号： G11C29/56 ,  G11C29/56012 ,  G11C2029/5602 ,  Y10T29/49004

摘要： A memory test system is disclosed. The memory system includes a memory device, a tester generating a clock signal and a test signal for testing the memory device, and an optical splitting module. The optical splitting module comprises an electrical-optical signal converting unit which converts each of the clock signal and the test signal into an optical signal to output the clock signal and the test signal as an optical clock signal and an optical test signal. The optical splitting unit further comprises an optical signal splitting unit which splits each of the optical clock signal and the optical test signal into n signals (n being at least two), and an optical-electrical signal converting unit which receives the split optical clock signal and the split optical test signal to convert the split optical clock signal and the split optical test signal into electrical signals used in the memory device.

摘要翻译： 记录测试系统被公开。 存储器系统包括存储器件，产生时钟信号的测试器和用于测试存储器件的测试信号，以及光分离模块。 光分路模块包括电光信号转换单元，其将时钟信号和测试信号中的每一个转换为光信号，以输出时钟信号和测试信号作为光时钟信号和光测试信号。 光分路单元还包括光信号分离单元，其将每个光时钟信号和光测试信号分解为n个信号（n至少为2个）;以及光电信号转换单元，其接收分离的光时钟信号 以及分离的光学测试信号，以将分离的光时钟信号和分割的光学测试信号转换成在存储器件中使用的电信号。