摘要:
A decimal floating point (DFP) unit is used to execute fixed point instructions. Two or more operands are accepted, wherein each operand is in a packed binary coded decimal (BCD) format. Any invalid BCD formats are detected by checking the operands for any invalid BCD codes. It is determined if an exception flag exists and, if so, outputting the flag; it is determined if a condition code exists and, if so, outputting the code. An operation is performed on the two or more operands to generate a result; wherein the operation takes place directly on BCD data, thus using the DFP unit to perform a BCD operation; appending a result sign to the result of the operation; and providing the result of the operation and the appended result sign as a result output in a packed BCD format.
摘要:
A decimal floating point (DFP) unit is used to execute fixed point instructions. Two or more operands are accepted, wherein each operand is in a packed binary coded decimal (BCD) format. Any invalid BCD formats are detected by checking the operands for any invalid BCD codes. It is determined if an exception flag exists and, if so, outputting the flag; it is determined if a condition code exists and, if so, outputting the code. An operation is performed on the two or more operands to generate a result; wherein the operation takes place directly on BCD data, thus using the DFP unit to perform a BCD operation; appending a result sign to the result of the operation; and providing the result of the operation and the appended result sign as a result output in a packed BCD format.
摘要:
Error detection using parity compensation in binary coded decimal (BCD) and densely packed decimal (DPD) conversions, including a computer program product having a tangible storage medium readable by a processing circuit and storing instructions for execution by the processing circuit for performing a method. The method includes receiving formatted decimal data in a first format, the formatted decimal data consisting of a DPD format data or a BCD format data. One or more first parity bits are generated by converting the received data into a second format of the formatted decimal data, and by determining the parity of the data in the second format. One or more second parity bits are generated directly from the received data. An error flag is set to indicate an error in the data in the second format in response to the first parity bits not being equal to the second parity bits.
摘要:
Error detection using parity compensation in binary coded decimal (BCD) and densely packed decimal (DPD) conversions, including a computer program product having a tangible storage medium readable by a processing circuit and storing instructions for execution by the processing circuit for performing a method. The method includes receiving formatted decimal data in a first format, the formatted decimal data consisting of a DPD format data or a BCD format data. One or more first parity bits are generated by converting the received data into a second format of the formatted decimal data, and by determining the parity of the data in the second format. One or more second parity bits are generated directly from the received data. An error flag is set to indicate an error in the data in the second format in response to the first parity bits not being equal to the second parity bits.
摘要:
A method for optimizing a scan chain ordering in circuit designs in an electronic computer-aided design system is provided. The method comprising: creating a schematic representative of a circuit design having a first cell and a second cell, the first cell and the second cell each having latches therein; creating a scan input pin and a scan output pin for each of the latches in the first cell and the second cell on the schematic; generating a first label on the schematic to provide a first wiring arrangement for the latches in the circuit design, the first wiring arrangement identifies a first order to which the scan input of each of the latches is wired to the scan output of another one of the latches; creating a layout representative of the circuit design; generating a first scan chain having a first length on the layout based on the first wiring arrangement; creating a second scan chain from the first scan chain on the layout, the second scan chain having a second length less than the first length of the first scan chain; and generating a second label on the schematic based on the second scan chain, the second label provides a second wiring arrangement for the latches in the circuit design, the second wiring arrangement identifies a second order to which the scan input of each of the latches is wired to the scan output of another one of the latches.
摘要:
A method for optimizing a scan chain ordering in circuit designs in an electronic computer-aided design system is provided. The method comprising: creating a schematic representative of a circuit design having a first cell and a second cell, the first cell and the second cell each having latches therein; creating a scan input pin and a scan output pin for each of the latches in the first cell and the second cell on the schematic; generating a first label on the schematic to provide a first wiring arrangement for the latches in the circuit design, the first wiring arrangement identifies a first order to which the scan input of each of the latches is wired to the scan output of another one of the latches; creating a layout representative of the circuit design; generating a first scan chain having a first length on the layout based on the first wiring arrangement; creating a second scan chain from the first scan chain on the layout, the second scan chain having a second length less than the first length of the first scan chain; and generating a second label on the schematic based on the second scan chain, the second label provides a second wiring arrangement for the latches in the circuit design, the second wiring arrangement identifies a second order to which the scan input of each of the latches is wired to the scan output of another one of the latches.
摘要:
A system and method for the fault simulation testing of circuits by using a behavioral model is provided. The behavioral model includes a fault bus, decoder, and input and output ports. The decoder decodes mapping fault values, which are applied to the fault bus, to either a no-fault or to a specific fault which is internally encoded into the behavioral model. Accordingly, a single behavioral model can be used to dynamically model a fault-free circuit or machine and one or more faulty circuits or machines based on the mapping fault data applied to each model's fault bus. A fault simulation tool applies test simulation data having mapping fault and test parameter data to at least two identically coded behavioral models (i.e., a fault-free model and a faulty model, as defined by the applied mapping fault data). Output data are generated by each behavioral model and recorded by the fault simulation tool. A comparison of the output data of the fault-free behavioral model and the at least one faulty behavioral model is performed to determine whether the test pattern data detected differences therebetween.