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    LIGHT EXTRACTION TRANSPARENT SUBSTRATE FOR ORGANIC EL ELEMENT, AND ORGANIC EL ELEMENT USING THE SAME
    1.
    发明申请
    LIGHT EXTRACTION TRANSPARENT SUBSTRATE FOR ORGANIC EL ELEMENT, AND ORGANIC EL ELEMENT USING THE SAME 有权
    用于有机EL元件的光萃取透明基材及使用其的有机EL元件

    公开(公告)号：US20140042426A1

    公开(公告)日：2014-02-13

    申请号：US14114175

    申请日：2012-04-25

    申请人： Suzushi Nishimura ,  Soon Moon Jeong ,  Maki Fukuda ,  Toshihiko Shibanuma

    发明人： Suzushi Nishimura ,  Soon Moon Jeong ,  Maki Fukuda ,  Toshihiko Shibanuma

    IPC分类号： F21V13/10 ,  H01L51/52

    CPC分类号： F21V13/10 ,  B82Y20/00 ,  H01L51/52 ,  H01L51/5275 ,  Y10S977/834

    摘要： A light extraction transparent substrate for an organic EL element includes a transparent supporting substrate; a diffraction grating having a first concavity and convexity layer having first concavities and convexities formed on a surface thereof, which is located on a surface of the transparent supporting substrate, and a microlens having a second concavity and convexity layer having second concavities and convexities formed on a surface thereof, which is located on a surface of the transparent supporting substrate. When a Fourier-transformed image is obtained by performing two-dimensional fast Fourier transform processing on a concavity and convexity analysis image obtained by analyzing the shape of each of the first and second concavities and convexities by use of an atomic force microscope, the Fourier-transformed image shows a circular or annular pattern substantially centered at an origin at which an absolute value of wavenumber is 0 μm−1.

    摘要翻译： 用于有机EL元件的光提取透明基板包括透明支撑基板; 衍射光栅，其具有在其表面上形成有第一凹凸的第一凹凸层，位于透明支撑基板的表面上，以及具有第二凹凸层的微透镜，所述微透镜具有形成在第二凹凸面上的第二凹凸层， 其表面位于透明支撑基板的表面上。 当通过使用原子力显微镜对通过分析第一和第二凹凸各自的形状而获得的凹凸分析图像进行二维快速傅立叶变换处理来获得傅里叶变换图像时， 变形图像示出了基本上位于波数绝对值为0mum-1的原点的圆形或环形图案。

    Light extraction transparent substrate for organic EL element, and organic EL element using the same
    2.
    发明授权
    Light extraction transparent substrate for organic EL element, and organic EL element using the same 有权
    有机EL元件的光提取透明基板和使用其的有机EL元件

    公开(公告)号：US09052096B2

    公开(公告)日：2015-06-09

    申请号：US14114175

    申请日：2012-04-25

    申请人： Suzushi Nishimura ,  Soon Moon Jeong ,  Maki Fukuda ,  Toshihiko Shibanuma

    发明人： Suzushi Nishimura ,  Soon Moon Jeong ,  Maki Fukuda ,  Toshihiko Shibanuma

    IPC分类号： H01L51/52 ,  F21V13/10 ,  B82Y20/00

    CPC分类号： F21V13/10 ,  B82Y20/00 ,  H01L51/52 ,  H01L51/5275 ,  Y10S977/834

    摘要： A light extraction transparent substrate for an organic EL element includes a transparent supporting substrate; a diffraction grating having a first concavity and convexity layer having first concavities and convexities formed on a surface thereof, which is located on a surface of the transparent supporting substrate, and a microlens having a second concavity and convexity layer having second concavities and convexities formed on a surface thereof, which is located on a surface of the transparent supporting substrate. When a Fourier-transformed image is obtained by performing two-dimensional fast Fourier transform processing on a concavity and convexity analysis image obtained by analyzing the shape of each of the first and second concavities and convexities by use of an atomic force microscope, the Fourier-transformed image shows a circular or annular pattern substantially centered at an origin at which an absolute value of wavenumber is 0 μm−1.

    摘要翻译： 用于有机EL元件的光提取透明基板包括透明支撑基板; 衍射光栅，其具有在其表面上形成有第一凹凸的第一凹凸层，位于透明支撑基板的表面上，以及具有第二凹凸层的微透镜，所述微透镜具有形成在第二凹凸面上的第二凹凸层， 其表面位于透明支撑基板的表面上。 当通过使用原子力显微镜对通过分析第一和第二凹凸各自的形状而获得的凹凸分析图像进行二维快速傅立叶变换处理来获得傅里叶变换图像时， 变形图像示出了基本上位于波数绝对值为0μm-1的原点的圆形或环形图案。

    Diffraction grating, organic EL element using the same, and manufacturing methods thereof
    4.
    发明授权
    Diffraction grating, organic EL element using the same, and manufacturing methods thereof 有权
    衍射光栅，使用其的有机EL元件及其制造方法

    公开(公告)号：US08541778B2

    公开(公告)日：2013-09-24

    申请号：US13384551

    申请日：2010-07-16

    申请人： Takashi Seki ,  Suzushi Nishimura ,  Maki Fukuda ,  Madoka Fukushima ,  Satoshi Masuyama ,  Soon Moon Jeong ,  Hideo Takezoe ,  Won Hoe Koo

    发明人： Takashi Seki ,  Suzushi Nishimura ,  Maki Fukuda ,  Madoka Fukushima ,  Satoshi Masuyama ,  Soon Moon Jeong ,  Hideo Takezoe ,  Won Hoe Koo

    IPC分类号： H01L51/52

    CPC分类号： G02B5/1809 ,  H01L51/5275 ,  H01L2251/105 ,  H05B33/10

    摘要： A diffraction grating having a transparent supporting substrate; and a cured resin layer which is stacked on the transparent supporting substrate and which has concavities and convexities formed on a surface thereof, wherein when a Fourier-transformed image is obtained by performing two-dimensional fast Fourier transform processing on a concavity and convexity analysis image obtained by analyzing a shape of the concavities and convexities formed on the surface of the cured resin layer by use of an atomic force microscope, the Fourier-transformed image shows a circular or annular pattern substantially centered at an origin at which an absolute value of wavenumber is 0 μm−1, and the circular or annular pattern is present within a region where an absolute value of wavenumber is within a range of 10 μm−1 or less.

    摘要翻译： 具有透明支撑基板的衍射光栅; 以及层叠在透明支撑基板上并且在其表面上形成有凹凸的固化树脂层，其中当通过对凹凸分析图像进行二维快速傅里叶变换处理获得傅里叶变换图像时， 通过使用原子力显微镜分析在固化树脂层的表面上形成的凹凸的形状而获得的傅立叶变换图像示出了基本上位于波数绝对值的原点的圆形或环形图案 为0mum-1，圆形或环状图案存在于波数绝对值在10mum -1以下的范围内。