摘要:
A diffraction grating having a transparent supporting substrate; and a cured resin layer which is stacked on the transparent supporting substrate and which has concavities and convexities formed on a surface thereof, wherein when a Fourier-transformed image is obtained by performing two-dimensional fast Fourier transform processing on a concavity and convexity analysis image obtained by analyzing a shape of the concavities and convexities formed on the surface of the cured resin layer by use of an atomic force microscope, the Fourier-transformed image shows a circular or annular pattern substantially centered at an origin at which an absolute value of wavenumber is 0 μm−1, and the circular or annular pattern is present within a region where an absolute value of wavenumber is within a range of 10 μm−1 or less.
摘要:
A diffraction grating having a transparent supporting substrate; and a cured resin layer which is stacked on the transparent supporting substrate and which has concavities and convexities formed on a surface thereof, wherein when a Fourier-transformed image is obtained by performing two-dimensional fast Fourier transform processing on a concavity and convexity analysis image obtained by analyzing a shape of the concavities and convexities formed on the surface of the cured resin layer by use of an atomic force microscope, the Fourier-transformed image shows a circular or annular pattern substantially centered at an origin at which an absolute value of wavenumber is 0 μm−1, and the circular or annular pattern is present within a region where an absolute value of wavenumber is within a range of 10 μm−1 or less.
摘要:
A transparent electroconductive substrate for a solar cell, comprising: a transparent supporting substrate; a transparent electroconductive layer; and a cured resin layer placed between the transparent supporting substrate and the transparent electroconductive layer, wherein concavities and convexities are formed on a surface of the cured resin layer, the surface facing the transparent electroconductive layer, and when a Fourier-transformed image is obtained by performing two-dimensional fast Fourier transform processing on a concavity and convexity analysis image obtained by analyzing a shape of the concavities and convexities by use of an atomic force microscope, the Fourier-transformed image shows a circular or annular pattern substantially centered at an origin at which an absolute value of wavenumber is 0 μm−1, and the circular or annular pattern is present within a region where an absolute value of wavenumber is within a range from 0.5 to 10 μm−1.
摘要:
An acoustic wave source and a radio wave source are installed close to each other on the ground. When an acoustic wave pulse is transmitted vertically into the atmosphere by the acoustic wave source, spherical wavefronts formed in the atmosphere by the acoustic wave are propagated upwardly at the velocity of sound. When a continuous radio wave is transmitted from the radio wave source toward the spherical wavefronts, it is reflected by the wavefronts and the reflected radio waves are converged to form a focusing spot on the ground. The position where the spot due to the convergence of the reflected radio waves is formed with the maximum intensity is detected by means of an antenna network formed of a multiplicity of receiving antennas laid out in the pattern of a lattice. The time-course change of such positions of the spots is traced to realize remote measurement of the height distribution of wind direction and speed in the atmosphere under surveillance.