公开(公告)号：US10859516B2

公开(公告)日：2020-12-08

申请号：US16334350

申请日：2017-09-20

申请人： System Square Inc.

发明人： Noriaki Ikeda ,  Sachihiro Nakagawa

IPC分类号： G01N23/04 ,  G01N23/087 ,  G01T1/24 ,  G01N23/18

摘要： An X-ray inspection apparatus includes: an X-ray emission unit for emitting an X-ray to an object; an X-ray detection unit for detecting each X-ray photon transmitted through the object by discriminating energy possessed by the photon into one or more energy region(s) in accordance with a predetermined threshold level; a storage unit for storing the object and the associated threshold level; a threshold level setting unit for referring to the storage unit to keep a threshold level for the object specified by inputted information so that the X-ray detection unit can refer to the threshold level as the predetermined threshold level; and an inspection unit for inspecting the object based on a number of photons or an amount corresponding to the number of the photons detected by the X-ray detection unit for each of the one or more energy region(s).