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公开(公告)号:US10529552B2
公开(公告)日:2020-01-07
申请号:US15905501
申请日:2018-02-26
IPC分类号: H01L21/02 , H01L21/311 , C09D125/06 , C09D133/12 , C09D125/16 , H01L21/027 , H01L21/768 , H01L21/033 , C09D125/18
摘要: In a method of manufacturing a semiconductor device, an underlying structure is formed. A surface grafting layer is formed on the underlying structure. A photo resist layer is formed on the surface grafting layer. The surface grafting layer includes a coating material including a backbone polymer, a surface grafting unit coupled to the backbone polymer and an adhesion unit coupled to the backbone polymer.
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公开(公告)号:US11276568B2
公开(公告)日:2022-03-15
申请号:US16732146
申请日:2019-12-31
IPC分类号: C09D125/06 , C09D125/18 , C09D133/12 , H01L21/02 , H01L21/027 , H01L21/311 , C09D125/16 , H01L21/768 , H01L21/033
摘要: In a method of manufacturing a semiconductor device, an underlying structure is formed. A surface grafting layer is formed on the underlying structure. A photo resist layer is formed on the surface grafting layer. The surface grafting layer includes a coating material including a backbone polymer, a surface grafting unit coupled to the backbone polymer and an adhesion unit coupled to the backbone polymer.
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