公开(公告)号：US20240296268A1

公开(公告)日：2024-09-05

申请号：US18337262

申请日：2023-06-19

Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.

Inventor： Fong-Yuan CHANG ,  Hui Yu LEE ,  Yu-Hao CHEN ,  Tian-Jian WU ,  Tien-Chien HUANG ,  Manjo Kumar ENUGULA ,  Yu-Lin WEI ,  Jyun-Hao CHANG

IPC: G06F30/31 ,  G06F30/323 ,  G06F30/327

CPC classification number: G06F30/31 ,  G06F30/323 ,  G06F30/327

Abstract: A method includes tagging source PDK devices (SPDs) in a source-circuit design (SCD); generating a source design simulation database (SDSD) based on source design key performance indicator (KPI) simulation data of the SPDs in the SCD; generating a target process design kit (PDK) simulation database (TPSD) based on target design KPI simulation data of a plurality of target-PDK devices (TPDs); creating a matching table based on the SDSD and the TPSD; matching, based on the matching table, one or more TPDs from the TPSD with each SPD in the SDSD based on SPD KPIs; ranking the one or more TPDs matched from the TPSD with each SPD in the SDSD based on the SPD KPIs; and exchanging, based on a migration mapping table that includes a one-to-one relationship for TPDs to the SPDs in the SCD, one or more SPDs in the SCD with one-to-one relational TPDs.