公开(公告)号：US20200292576A1

公开(公告)日：2020-09-17

申请号：US16324686

申请日：2017-08-07

Applicant: TECHNOPROBE S.P.A.

Inventor： DANIELE PEREGO

IPC: G01R1/067 ,  G01R1/073 ,  G01R31/28

Abstract: It is herein described a contact probe of a testing head of an apparatus for testing electronic devices comprising a probe body being essentially extended in a longitudinal direction between respective end portions adapted to realize a contact with respective contact pads, at least one end portion having transverse dimensions greater than the probe body and comprising an enlarged portion, projecting only in correspondence of a first side wall of the contact probe. Suitably, the at least one end portion further comprises at least one protrusion projecting from a second side wall, opposite to the first side wall and substantially extending toward the second and opposite wall along a longitudinal axis of the contact probe starting from the enlarged portion.