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公开(公告)号:US20180186006A1
公开(公告)日:2018-07-05
申请号:US15879190
申请日:2018-01-24
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: CHARLES KASIMER SESTOK, IV , ALAN HENRY LEEK , BJOERN OLIVER EVERSMANN , MATTHEW JUSTIN CALVO
CPC classification number: G01N27/02 , A47L9/2826 , B25J9/1694 , B65G47/905
Abstract: A system includes a controller to provide at least one control output to an automated system in response to a control command received at a control input of the controller. The control output controls the operation of the automated system based on the control command. A signature analyzer generates the control command to the controller and receives an impedance signature related to a property of a material or object encountered by the automated system. The signature analyzer compares the impedance signature to at least one comparison signature to determine the property of the material or object. The signature analyzer adjusts the control command to the controller to control the operation of the automated system based on the determined property.
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公开(公告)号:US20180180652A1
公开(公告)日:2018-06-28
申请号:US15389053
申请日:2016-12-22
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: CHARLES KASIMER SESTOK, IV , SRINATH RAMASWAMY , ANAND GANESH DABAK , DOMINGO G. GARCIA , BAHER HAROUN , ALAN HENRY LEEK , RYAN MICHAEL BROWN
IPC: G01R27/16
Abstract: A microcontroller-based system for measuring the impedance of a device under test (DUT), responsive to a square wave stimulus, includes parallel stimulus signal paths, selectable by a switch, that can correspond to different stimulus frequency ranges. At least one of the paths includes an off-chip PLL and integer divider circuit to modify the frequency of the stimulus. A discrete Fourier transform executed by a processor is used to determine the impedance of the DUT at the stimulus frequency. Multiple frequencies can be analyzed at the same time by using a summation circuit and/or by analyzing odd harmonics of the stimulus frequency.
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