公开(公告)号：US20200096574A1

公开(公告)日：2020-03-26

申请号：US16137146

申请日：2018-09-20

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Xiong LI ,  William TOTH ,  Honglin GUO ,  Danyang ZHU

IPC: G01R31/40 ,  H03K19/20 ,  H02H1/00 ,  H02H3/20 ,  H03K5/24 ,  G01R31/26

Abstract: A device that comprises a first semiconductor die and a second semiconductor die. The first semiconductor die comprises a first clock signal generator. The second semiconductor die comprises a fault detection circuit, the fault detection circuit comprising a second clock signal generator, a first counter coupled to the second clock signal generator, multiple storage devices coupled to the second clock signal generator and to the first counter, a logic gate coupled to the multiple storage devices, a second counter coupled to the logic gate and to the first clock signal generator, and a comparator coupled to the logic gate and the second counter.