Methods and systems for analysis
    5.
    发明授权

    公开(公告)号:US11249046B2

    公开(公告)日:2022-02-15

    申请号:US16676603

    申请日:2019-11-07

    摘要: Provided herein are systems and methods for the detection, quantification, and/or monitoring of analytes in samples. The systems and methods can be used, for example, to track the deposition and electrochemical behavior of individual nanoparticles and nanoparticles clusters clusters in situ with high spatial and temporal resolution. The systems and methods can be used to track the deposition and oxidation of several hundreds to thousands of nanoparticles simultaneously and reconstruct their voltammetric curves at the single nanoparticle level.

    METHODS AND SYSTEMS FOR ANALYSIS
    6.
    发明申请

    公开(公告)号:US20200088679A1

    公开(公告)日:2020-03-19

    申请号:US16676603

    申请日:2019-11-07

    IPC分类号: G01N27/42

    摘要: Provided herein are systems and methods for the detection, quantification, and/or monitoring of analytes in samples. The systems and methods can be used, for example, to track the deposition and electrochemical behavior of individual nanoparticles and nanoparticles clusters clusters in situ with high spatial and temporal resolution. The systems and methods can be used to track the deposition and oxidation of several hundreds to thousands of nanoparticles simultaneously and reconstruct their voltammetric curves at the single nanoparticle level.